“…This effect is associated to the degradation of the gate dielectric of the devices along the time due to the presence of interface traps and is responsible for the degradation of the drain current and threshold voltage of the transistors. The JNTs are doped with the same type of dopant, for the channel, source and drain, which results in advantages such as the smaller short-channel effect, allowing for a greater miniaturization in relation to other structures 1 . JNTs present most of the charge, flowing through the interior of the channel instead of the interfaces, besides presenting a lower electric field in the channel region.…”