2024
DOI: 10.1109/tns.2023.3253100
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Key Factors of Laser-Induced Single Event Transients on Different SiGe Process

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“…The algorithms used in XRC for calculating XRR are described in detail elsewhere (Penkov et al, 2020;Li et al, 2023). The Parratt algorithm is used for simulating specular XRR.…”
Section: X-ray Reflectivitymentioning
confidence: 99%
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“…The algorithms used in XRC for calculating XRR are described in detail elsewhere (Penkov et al, 2020;Li et al, 2023). The Parratt algorithm is used for simulating specular XRR.…”
Section: X-ray Reflectivitymentioning
confidence: 99%
“…9(b)]. These PMMs were deposited using pulse DC sputtering for Mo and RF sputtering for B as described by Li et al (2023) and Penkov et al (2021). The substrate holder was water cooled during the deposition, so the temperature did not exceed 50 � C. The XRR was measured using a Malvern Panalytical Empyrean diffractometer equipped with a W/Si Go ¨bel mirror in monochromatic Cu K� 1 radiation.…”
Section: Periodic X-ray Mirrorsmentioning
confidence: 99%
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