Extended Abstracts of the 2016 International Conference on Solid State Devices and Materials 2016
DOI: 10.7567/ssdm.2016.ps-10-15-10l
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KF Addition to Cu<sub>2</sub>SnS<sub>3</sub> Thin Films Prepared by Sulfurization Process

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“…The curve gradually decreases at longer wavelengths, suggesting a shorter carrier diffusion length and lower collection efficiency in the bulk of the CTS absorber. 7,49 The major loss of EQE between 600 and 1300 nm is a result of the insufficient generation and poor collection of carriers at the back side, revealing a large potential for further improvements in J sc and efficiency by achieving a homogeneously well-developed microstructure throughout the CTS absorber's thickness. 7,46,49 The band gap of the absorber layer was estimated from the EQE and found to be 1.06 eV.…”
Section: Chemistry Of Materialsmentioning
confidence: 99%
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“…The curve gradually decreases at longer wavelengths, suggesting a shorter carrier diffusion length and lower collection efficiency in the bulk of the CTS absorber. 7,49 The major loss of EQE between 600 and 1300 nm is a result of the insufficient generation and poor collection of carriers at the back side, revealing a large potential for further improvements in J sc and efficiency by achieving a homogeneously well-developed microstructure throughout the CTS absorber's thickness. 7,46,49 The band gap of the absorber layer was estimated from the EQE and found to be 1.06 eV.…”
Section: Chemistry Of Materialsmentioning
confidence: 99%
“…7,49 The major loss of EQE between 600 and 1300 nm is a result of the insufficient generation and poor collection of carriers at the back side, revealing a large potential for further improvements in J sc and efficiency by achieving a homogeneously well-developed microstructure throughout the CTS absorber's thickness. 7,46,49 The band gap of the absorber layer was estimated from the EQE and found to be 1.06 eV. In addition, the low V oc (V oc deficit) value of 0.327 V in the high-efficiency CTS absorber was strongly related to the high carrier recombination in the p−n junction resulting from the high defect density, which can be indirectly calculated by (E g /q) − V oc .…”
Section: Chemistry Of Materialsmentioning
confidence: 99%
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