1998
DOI: 10.1016/s0022-3093(98)00658-9
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Kinetic structure of glass transition in polymer interfaces between filler and SBR matrix

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Cited by 36 publications
(33 citation statements)
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“…Assuming lamellar morphology this fi nding refl ects a 1-2 nm size of the overall distorted fraction. It is noteworthy that other groups in literature [62][63][64][65][66][67] using different experimental methods to determine the size of the interface layer surrounding nanofi llers in polymer matrices have reported values between 1-4 nm, which is fairly close to the fi ndings reported here. Although the build-up dependences are basically identical for all the prepared systems during initial stages of 1 H-1 H spin diffusion, considerable differences appear at later stages (marked with gray arrows in Figure 8 ).…”
Section: Nds [Wt%]supporting
confidence: 90%
“…Assuming lamellar morphology this fi nding refl ects a 1-2 nm size of the overall distorted fraction. It is noteworthy that other groups in literature [62][63][64][65][66][67] using different experimental methods to determine the size of the interface layer surrounding nanofi llers in polymer matrices have reported values between 1-4 nm, which is fairly close to the fi ndings reported here. Although the build-up dependences are basically identical for all the prepared systems during initial stages of 1 H-1 H spin diffusion, considerable differences appear at later stages (marked with gray arrows in Figure 8 ).…”
Section: Nds [Wt%]supporting
confidence: 90%
“…An intuitive explanation is that shorter particle-particle distances immobilize large network mode lengths. This implies (via the fluctuation dissipation theorem 15 ) higher shear moduli of the matrix.…”
Section: Strain Sweepsmentioning
confidence: 97%
“…Since this is the transition zone of the rubber matrix, that is, the transition from the glassy to the rubbery zone, this behavior indicates that the reinforcing fillers affect molecular motions with mode lengths of order of several nanometers. 15 …”
Section: Frequency Sweepsmentioning
confidence: 99%
“…[29] For poly (dimethylsiloxane)/silica systems DD was about 1-2.5 nm using dielectric measurements, [30,31] %5 nm using neutron scattering, [32] and 0.8 nm using NMR. [33] For SBR/silica systems values of 1.5-1.9 nm [34,35] have been found using mechanical measurements.…”
Section: Fracture Behavior and Interfacial Thicknessmentioning
confidence: 99%