Kinetics of alloy formation at the interfaces in a Ni-Ti multilayer: X-ray and neutron reflectometry study

Stoichiometry dependent inter diffusion and structural evolution in Al–Ni multilayer

“…4 for S1 (left panel: (a-d)) and for S2 (right panel: (e-h)), respectively. Oscillations observed in the ASYM profiles are due to the layer thickness while the amplitude of the oscillations arises because of the contrast between the spin-up and spin-down reflectivities [21,22]. The large amplitude of oscillations in the ASYM parameter in the upper panels of Fig.…”

“…Thus XRR and PNR together can identify the interface alloy stoichiometry in case of binary systems [19,20]. In addition, PNR also gives magnetic scattering length density (MSLD) or magnetic moment profile in a sample as a function of depth [21,22]. In present study, we obtained magnetic moment of Ni as a function of annealing temperature in both the samples.…”

“…PNR data were also used to investigate the evolution of magnetization as a function of annealing temperature for these samples. The spin ASYM function is defined as the ratio between the difference and sum of spin dependent reflectivity [ASYM = (R + À R À )/(R + + R À )], where R + and R À are neutron reflectivities for neutron with polarization parallel and anti-parallel respectively to the sample magnetization [21,22]. Variation of the ASYM function (closed circles, red 1 ) as a function of annealing temperature along with the fits (solid lines) is given in Fig.…”

“…The PNR data were collected at DHRUVA reactor, India [17]. XRR and PNR are non-destructive tools which provide density profile as a function of depth with nanometer resolutions [18][19][20][21][22]. PNR data allowed us to obtain the nuclear scattering length densities (NSLD) depth profile in the samples and XRR data was used to obtain electron scattering length densities (ESLD).…”

Specular and off-specular polarized neutron reflectivity at Dhruva

“…In order to understand the magnetic properties of interfaces in nanostructures, detailed structural and magnetic characterization as well as their correlation is required. Polarized neutron refl ectivity (PNR) and X-ray refl ectivity (XRR) are two nondestructive techniques that provide quantitative measures of the physical and magnetic depth profi les in fi lms with better than nanometer resolution [1][2][3][4][5].…”