1989
DOI: 10.1016/0032-3861(89)90018-9
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Kinetics of crystallization and melting behaviour of poly(ethylene naphthalene-2,6-dicarboxylate)

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Cited by 258 publications
(204 citation statements)
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“…The relation between sample thickness t and absorbance can be described as follows. (2) where Io and I are the incident and transmitted X-ray intensities, and u is the absorption coefficient of PEN polymer calculated from the chemical formulae and density. Using the obtained sample thickness, the integrated intensity I can be converted to the standardized integrated intensity I* as follows.…”
Section: Thermal Analysismentioning
confidence: 99%
“…The relation between sample thickness t and absorbance can be described as follows. (2) where Io and I are the incident and transmitted X-ray intensities, and u is the absorption coefficient of PEN polymer calculated from the chemical formulae and density. Using the obtained sample thickness, the integrated intensity I can be converted to the standardized integrated intensity I* as follows.…”
Section: Thermal Analysismentioning
confidence: 99%
“…Buchner et al have suggested that every naphthalene ring is twisted around the chain axis by about 180° in the β-crystal. 2 It was also reported that the β-crystal can be formed when the isotropic melt is crystallized at temperatures higher than 220°C. 2,3 There have been previous studies on hot-drawing and cold-drawing processes for PEN fibers and films, 4,5 wherein the drawability of amorphous PEN was reported to depend on the molecular weight and strain rate.…”
Section: Introductionmentioning
confidence: 97%
“…2 It was also reported that the β-crystal can be formed when the isotropic melt is crystallized at temperatures higher than 220°C. 2,3 There have been previous studies on hot-drawing and cold-drawing processes for PEN fibers and films, 4,5 wherein the drawability of amorphous PEN was reported to depend on the molecular weight and strain rate. The structural changes upon neck drawing of amorphous PEN films have been investigated through off-line measurements using synchrotron X-ray radiation, 4,6 which revealed the appearance of smectic order with a period of 1.25 nm corresponding to a chain repeat length associated with a sinusoidal conformation of the polymer chains.…”
Section: Introductionmentioning
confidence: 97%
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“…The inter-stem distance in the (100) plane of PTFE is reported as 0.566nm [22], and that in the (100) plane of PEN a-form is:computed to be b -sing = 0.568nm. Therefore, the degree of lattice mismatch is estimated at [11]. However, further investigation is needed to associate this reflection with the /3-form or a new crystal modification of PEN.…”
Section: Introductionmentioning
confidence: 99%