The galvanostatic electrodeposition of manganese dioxide films onto a platinum substrate is studied over a thickness range from 0 to 2000 nm. At the upper end of the thickness range, optical absorption causes the ellipsometer null settings to approach within 0.02 ~ of the infinite thickness limit, at which the films are indistinguishable from sub. strates. The optical extinction coefficient increases with film thickness over the range 0-50 nm, but from 50 to 160 nm the films have optical constants which are independent of thickness but which depend on the deposition current density. Beyond 160 rim, the optical data become progressively more difficult to interpret in terms of uniform isotropic or anisotropic film models. When relatively thin films (50 nm) are transferred to alkaline electrolyte and are cycled galvanostatical]y, optical changes are observed which correlate well with the electrochemical behavior for both reversible partial discharge cycles and irreversible complete discharge cycles.In a previous ellipsometric study (1), Spricis et al. found the optical properties of manganese dioxide films to be quite sensitive to the deposition conditions. The deposition was carried out using a sequence of potentiostatic pulses which enabled the process to be studied using a conventional ellipsometer, and increases in deposition potential and pulse duration were both reported to lower the extinction coefficient of the film by as much as a factor of two. For thicknesses below 40 nm, both the refractive index and the extinction coefficient were reported to vary somewhat with film thickness, and above about 70 nm the optical data were found to deviate from the theoretical curves. The thickness dependences were attributed to insular structure in the thinner films and surface roughening in the thicker films, and the extinction coefficient variation was attributed at least partially to a change in porosity.In this paper, we use an automated ellipsometer to follow the galvanostatic deposition and charge-discharge cycling of manganese dioxide films. We study deposition over a current density range of 64 for thicknesses up to 2000 nm to see whether the reported dependence on thickness and deposition rate is found also under galvanostatic conditions. In the optical analysis, we use both isotropic and anisotropic film models to see whether or not the dependence of refractive index on film thickness is an artifact resulting from isotropic analysis of an anisotropic system. The objective of the study of charge-discharge cycles in alkaline electrolyte is more to evaluate the usefulness of ellipsometry for such measurements than to provide any definitive statement about the processes involved. Ellipsometry is an effective tool for the study of homogeneous film-conversion processes, but heterogeneous processes can only be studied if the film remains stratified.This investigation forms part of our continuing study of oxidation and reduction processes which involve ionic transport through thin solid films. Included in this ...