L-shell X-ray production cross sections in metal oxide thin films due to 12C, 16O and 28Si ion beams at MeV SIMS energies

Msimanga, M.; Pineda-Vargas, C.A.; Madhuku, M.

doi:10.1016/j.nimb.2018.08.050

Cited by 5 publications

(8 citation statements)

References 28 publications

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“…This extent of screening is low enough such that the treatment of the ion potential as a plane wave, along with energy loss and target perturbation corrections are largely valid using ECPSSR predictions. This assertion is drawn from experimental work reported in 5 , 6 , particularly where projectile charge states are above 3. Electronic perturbation is however high in the low energy limit due to higher screening, such that corrections by the ECPSSR become insufficient for some collision systems, even asymmetric ones.…”

Section: Approachmentioning

confidence: 95%

“…PIXE is routinely carried out with techniques such as Rutherford Backscattering (RBS) or Particle Induced γ-Ray emission (PIGE) spectroscopy in many IBA laboratories, but using light projectiles (such as protons or helium ions) instead. The potential of heavy ion (~ Z ≥ 6) probes to boost IBA technique capabilities lies largely on the relatively higher ion-atom interaction cross sections compared to those due to light projectiles 5 , 6 . This especially implies higher sensitivity for the detection of both light and high Z 2 elements emanating from the same projectile-target interactions, e.g.…”

Section: Introductionmentioning

confidence: 99%

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Semi-empirical parameterization of HI/p L-shell X-ray production cross section ratios in Bi for Heavy Ion PIXE

Masekane,

Msimanga,

Bogdanović Radović

et al. 2023

Sci Rep

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Quantitative analysis of materials from Heavy Ion PIXE spectra remains impeded by the lack of reliable X-ray production cross section (XPCS) data. Although efforts at experimental Heavy Ion induced XPCS measurements still continue, Multiple Ionisation (MI) effects, which are not fully described by theory, render simulations of heavy ion PIXE data unreliable for large Z1/Z2 collisions, especially at low energies. This is also exacerbated by the random selection of projectile-target combinations for measured and reported experimental data available to validate theory. This study explored heavy ion induced X-ray production cross section deviations from those induced by protons at the same ion velocity. This enabled evaluations of the degree to which cross sections are enhanced through MI effects, with the aim of predicting XPCS due to heavy ion impact. The evaluation was carried out through the scaling of experimental heavy ion to theoretical proton cross section ratios (R), which were then used for the interpolation of XPCS in the same target element for ‘missing’ projectiles within the range of evaluation. Here we present measurements of heavy ion induced total L-shell XPCS in Bi, carried out to determine HI/p MI induced deviations due to C, F, Cl and Ti projectiles at an ion velocity range of (0.2–1.0) MeV/nucleon.

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Section: Approachmentioning

confidence: 95%

Section: Introductionmentioning

confidence: 99%

Semi-empirical parameterization of HI/p L-shell X-ray production cross section ratios in Bi for Heavy Ion PIXE

Masekane,

Msimanga,

Bogdanović Radović

et al. 2023

Sci Rep

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Section: Figure 1 C F and Cl R-values In Bi Full Lines Are Fits Of Th...mentioning

confidence: 99%

“…Heavy ion induced XPCS were evaluated through the analysis of PIXE and RBS data for individual projectiletarget combinations through Equation 2 [5]. A more comprehensive description of the calculation procedure is detailed in [22,23].…”

Section: X-ray Production Cross Section Evaluationmentioning

confidence: 99%

“…PIXE is routinely carried out with techniques such as Rutherford Backscattering (RBS) or Particle Induced -Ray emission (PIGE) spectroscopy in many IBA laboratories, but using light projectiles (such as protons or helium ions) instead. The potential of heavy ion (~ Z ≥ 6) probes to boost IBA technique capabilities lies largely on the relatively higher ion-atom interaction cross sections compared to those due to light projectiles [5,6]. This especially implies higher sensitivity for the detection of both light and high Z2 elements emanating from the same projectile-target interactions, e.g recoil production.…”

Section: Introductionmentioning

confidence: 99%

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Semi-empirical parameterization of HI/p L-shell X-ray production cross section ratios in Bi for Heavy Ion PIXE

Masekane,

Msimanga,

Radović

et al. 2023

Preprint

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Quantitative analysis of materials from Heavy Ion PIXE spectra remains impeded by the lack of reliable X-ray production cross section (XPCS) data. Although efforts at experimental Heavy Ion induced XPCS measurements still continue, Multiple Ionisation (MI) effects, which are not fully described by theory, render simulations of Heavy Ion PIXE data unreliable for large Z 1 /Z 2 collisions, especially at low energies. This is also exacerbated by the random selection of projectile-target combinations for measured and reported experimental data available to validate theory. This study explored heavy ion induced X-ray production cross section deviations from those induced by protons at the same ion velocity. This enabled evaluations of the degree to which cross sections are enhanced through MI effects, with the aim of predicting XPCS due to heavy ion impact. The evaluation was carried out through the scaling of experimental heavy ion to theoretical proton cross section ratios (R), which were then used for the interpolation of XPCS in´missing´in´missing´ regions. Here we present measurements of heavy ion induced total L-shell XPCS in Bi, carried out to determine HI/p MI induced deviations due to C, F, Cl and Ti projectiles at an ion velocity range of 0.2-1.0 (MeV/nucleon).

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Measurement of L-shell X-ray production cross sections in 89Y, 158Gd and 209Bi due to 0.3 MeV/u – 1.0 MeV/u 12C ions

Ejeh

Hlatshwayo

Madhuku

et al. 2021

Applied Radiation and Isotopes

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L-shell X-ray production cross sections in metal oxide thin films due to 12C, 16O and 28Si ion beams at MeV SIMS energies

Cited by 5 publications

References 28 publications

Semi-empirical parameterization of HI/p L-shell X-ray production cross section ratios in Bi for Heavy Ion PIXE

Semi-empirical parameterization of HI/p L-shell X-ray production cross section ratios in Bi for Heavy Ion PIXE

Semi-empirical parameterization of HI/p L-shell X-ray production cross section ratios in Bi for Heavy Ion PIXE

Measurement of L-shell X-ray production cross sections in 89Y, 158Gd and 209Bi due to 0.3 MeV/u – 1.0 MeV/u 12C ions

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