“…for an electron transition X j → M i , where ζ is a normalization factor, 10 N A is the Avogadro’s constant, A is the atomic weight of the analyzed element, ε ( E M i X j ) is the intrinsic efficiency of the X-ray detector at the energy E M i X j of the characteristic line, S / ρ and μ / ρ are, respectively, the mass stopping power and mass attenuation coefficient of the material, whose mass density is ρ , α and β are the beam incidence angle and X-ray takeoff angle, respectively, both measured from the normal to the sample surface, and Y M i X j ( E 0 ) is the number of detected M i X j characteristic photons per incident proton, hereafter abbreviated to ‘X-ray yield’.…”