Laboratory-based reflectometer using line spectra of an RF-induced gas-discharge lamp in 30- to 200-nm wavelength range

Yu, Yue; Ye, Zeyi; Jiang, Li; Yao, Q. J.; Li, Shuangying; Wu, Jiali; Zhang, Jinlong; Huang, Qiushi; Xie, Changsheng; Sokolov, Andréy; Zhou, Hongjun; Huo, Tonglin; Li, Wenbin; Wang, Zhanshan

doi:10.1117/1.jatis.8.1.017002

Cited by 6 publications

(4 citation statements)

References 29 publications

(32 reference statements)

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“…The EUV reflectivity is measured by the EUV reflectometer using line spectra at 46.1 nm generated by a radio frequency induced gas-discharge lamp at IPOE at the incidence angle of 5° [14]. The reflectivity error was less than 2%.…”

Section: Optical Performancementioning

confidence: 99%

Development of the Sc/Si multilayer mirrors with high spectral selectivity for the Solar Upper Transition Region Imager

Wu,

Qi,

et al. 2024

Sixth Conference on Frontiers in Optical Imaging and Technology: Novel Technologies in Optical Systems

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The Solar Upper Transition Region Imager (SUTRI) was proposed to observe for the first time the Ne VII line at 46.5nm emitted from the upper solar transition region. As the key optical elements of the SUTRI, Sc/Si multilayer reflective mirrors are developed to offer high spectral selectivity and high reflectivity at 46.5nm with a normal-incidence angle. To avoid spectral contamination, the reflective bandwidth of the multilayer is required less than 4nm, which is achieved when the Sc layer thickness ratio is tuned to above 0.65. Meanwhile, the mechanical property, resistivity to thermal cycling, and temporal stability of the Sc/Si multilayer are characterized. The addition of an ultrathin Si layer (thickness of 0.6nm) in each Sc layer decreased the crystallization of Sc and flatted the interface, resulting in the enhancement of the mechanical property of the Sc/Si multilayer with new structure. After three times of thermal cycling, the temperature from 5°C to 40°C, the surface morphology of the new Sc/Si multilayer remained unchanged. The grazing incidence reflectometer test results showed that the periodic structure and thickness of the new multilayer were still similar after 2 years of storage. The optimized Sc/Si multilayer has a d-spacing of 24.55nm and a Sc thickness ratio of 0.72, achieving the extreme ultraviolet reflectivity of 28% at 46.1nm obtained from the laboratory-based reflectometer. The optimized Sc/Si multilayer mirrors have been applied in the SUTRI and received bright solar images at 46.5nm.

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Section: Optical Performancementioning

confidence: 99%

Development of the Sc/Si multilayer mirrors with high spectral selectivity for the Solar Upper Transition Region Imager

Wu,

Qi,

et al. 2024

Sixth Conference on Frontiers in Optical Imaging and Technology: Novel Technologies in Optical Systems

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“…Reflectivity, as a function of angle, was measured using a specialized extreme ultraviolet reflectometer [28]. Utilization of this apparatus permitted the quantification of reflectivity within the extreme ultraviolet (EUV) spectral domain spanning 30-200 nm.…”

Section: Measurements and Data Analysismentioning

confidence: 99%

Study of Optical Performance and Structure of Yb/Al (1.5 wt.% Si) and Yb/Al (Pure) Multilayers Designed for the 73.6 nm Range

Lai,

Qi,

Zhang

et al. 2024

Coatings

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Yb/Al multilayer films exhibit excellent theoretical reflectivity in the 54–90 nm wavelength range. This study attempted to incorporate 1.5% wt.% of Si impurities into Al to suppress the crystallization of Al, reduce interfacial roughness, and enhance the actual reflectivity of the prepared Yb/Al multilayer films. Internal microstructure changes in the film layers before and after Si impurity doping were investigated using GIXRR, AFM, and XRD techniques. The reflectivity of two types of multilayer films, Yb/Al (1.5 wt.% Si) and Yb/Al (pure), was tested to evaluate the effect of Si impurity on film performance. The reflectivity of Yb/Al (1.5 wt.% Si) multilayers compared to Yb/Al (pure) multilayers increased by approximately 4%.

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“…The test result on the BESSY-II facility (Sokolov et al 2014) shows that a bandwidth (FWHM) of 3.68 nm is achieved with the peak wavelength at 45.5 nm (Wu et al 2022). The reflectivity of the flight mirror is measured by the EUV reflectometer using line spectra at 46.1 nm generated by a radio frequency induced gas-discharge lamp at Tongji University (Yu et al 2022) at the incidence angle of 5°. The multilayer structure is further optimized to achieve higher reflectivity at 46.1 nm.…”

Section: Optical and Mechanical Structurementioning

confidence: 99%

The Solar Upper Transition Region Imager (SUTRI) Onboard the SATech-01 Satellite

Bai

Tian

Yuan-yong

et al. 2023

Res. Astron. Astrophys.

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The Solar Upper Transition Region Imager (SUTRI) onboard the Space Advanced Technology demonstration satellite (SATech-01), which was launched to a sun-synchronous orbit at a height of $\sim$500 km in July 2022, aims to test the on-orbit performance of our newly developed Sc/Si multi-layer reflecting mirror and the 2k$\times$2k EUV CMOS imaging camera and to take full-disk solar images at the Ne VII 46.5 nm spectral line with a filter width of $\sim$3 nm. SUTRI employs a Ritchey-Chrétien optical system with an aperture of 18 cm. The on-orbit observations show that SUTRI images have a field of view of $\sim$ 41.6’$\times$41.6’ and a moderate spatial resolution of $\sim$8” without an image stabilization system. The normal cadence of SUTRI images is 30 s and the solar observation time is about 16 hours each day because the earth eclipse time accounts for about 1/3 of SATech-01’s orbit period. Approximately 15 GB data is acquired each day and made available online after processing. SUTRI images are valuable as the Ne VII 46.5 nm line is formed at a temperature regime of $\sim$0.5 MK in the solar atmosphere, which has rarely been sampled by existing solar imagers. SUTRI observations will establish connections between structures in the lower solar atmosphere and corona, and advance our understanding of various types of solar activity such as flares, filament eruptions, coronal jets and coronal mass ejections.

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Laboratory-based reflectometer using line spectra of an RF-induced gas-discharge lamp in 30- to 200-nm wavelength range

Cited by 6 publications

References 29 publications

Development of the Sc/Si multilayer mirrors with high spectral selectivity for the Solar Upper Transition Region Imager

Development of the Sc/Si multilayer mirrors with high spectral selectivity for the Solar Upper Transition Region Imager

Study of Optical Performance and Structure of Yb/Al (1.5 wt.% Si) and Yb/Al (Pure) Multilayers Designed for the 73.6 nm Range

The Solar Upper Transition Region Imager (SUTRI) Onboard the SATech-01 Satellite

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