“…Thus, samples may arc at a less negative bias in LEO than in GEO. Cho et al [13] have shown that whereas standard array samples may show arcing at −150 to −200 V in a simulated LEO plasma, in a simulated GEO plasma similar samples may have an arcing threshold at about −400 V. Recently, Vayner et al [14] have shown a factor of three higher threshold voltage for solar arrays in the simulated GEO conditions compared to LEO.…”
Section: Are Leo Conditions Valid For Geo Arc-threshold Testing?mentioning
confidence: 98%
“…After the fact, individual arc sites can be located from time-stamps on the arc-detection circuitry. In fact, Cho et al [13] have developed a special technique to image a sample on a charge coupled device (CCD) camera and to digitize the positions of the arc sites with a computer program.…”
Section: Plasma Sources and Plasma Diagnosticsmentioning
“…Thus, samples may arc at a less negative bias in LEO than in GEO. Cho et al [13] have shown that whereas standard array samples may show arcing at −150 to −200 V in a simulated LEO plasma, in a simulated GEO plasma similar samples may have an arcing threshold at about −400 V. Recently, Vayner et al [14] have shown a factor of three higher threshold voltage for solar arrays in the simulated GEO conditions compared to LEO.…”
Section: Are Leo Conditions Valid For Geo Arc-threshold Testing?mentioning
confidence: 98%
“…After the fact, individual arc sites can be located from time-stamps on the arc-detection circuitry. In fact, Cho et al [13] have developed a special technique to image a sample on a charge coupled device (CCD) camera and to digitize the positions of the arc sites with a computer program.…”
Section: Plasma Sources and Plasma Diagnosticsmentioning
“…During this state, it is considered that ESD is not likely to occur because the threshold value of the potential different for a discharge to occur is about several kilovolts for normal potential gradient, whereas the threshold is only about 400V for inverted potential gradient. 7) Through this process, ELFs-charm is therefore capable to mitigate ESD on solar arrays and spacecraft. In 2012, Kyushu Institute of Technology launched HORYU-II to a Polar Earth Orbit to do flight demonstration of ELFs-charm.…”
Section: Research Purpose and Backgroundmentioning
“…The cells have IBF (Integration Bypass Fumction), which allows the current flow from N to P electrode in the cell even if the cell can not generate the electric power. The gap between strings are glued by RTV (Room Temperature Vulcanizing) silicone rubber to prevent the sustained arc [8,9].…”
A degradation test for a solar array coupon against ESD was performed under simulated Low Earth Orbit environment. All tests were performed in a vacuum chamber with a plasma source. A test coupon was biased at-400V with the aim of developing the next generation 400V high voltage solar array. The LCR circuit was used in order to simulate the arc current that flows by gathering the charge stored on coverglasses. Tests were repeated until the solar array coupon was damaged. The arc locations and waveforms of both current and voltage were detected for all the arcs during the tests. The electrical performance of the coupon was measured after every test without opening the vacuum chamber. Many arcs occurred and caused the cell degradation. The cell was damaged by only one arc that occurred at the edge of cell, not at electrodes.
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