2020
DOI: 10.1002/solr.202000134
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Large‐Area Boron‐Doped 1.6 Ω cm p‐Type Czochralski Silicon Heterojunction Solar Cells with a Stable Open‐Circuit Voltage of 736 mV and Efficiency of 22.0%

Abstract: Herein, large‐area defect‐engineered p‐type silicon heterojunction (SHJ) solar cells using standard 1.6 Ω cm commercial‐grade boron‐doped Czochralski (Cz) silicon wafers are fabricated. It is demonstrated that despite achieving an open‐circuit voltage of 735 mV with an efficiency of 21.6% for gettered samples, without appropriate treatment, the cells are heavily susceptible to boron–oxygen‐related light‐induced degradation (LID), with the effective lifetime at maximum power point decreasing to 13 μs. This degr… Show more

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Cited by 13 publications
(9 citation statements)
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“…In p‐type SHJ solar cells, surface‐related recombination affecting the low‐injection range is known to severely limit the FF of such devices. [ 74,92,107 ] This was illustrated by Descoeudres et al in 2013, where SHJ solar cells fabricated with n‐ and p‐type FZ‐Si wafers with conversion efficiencies >21% were compared. [ 107 ] In their report, despite both p‐ and n‐type devices achieving comparable peak‐ V OC values the conversion efficiency of the champion p‐type SHJ solar cell (21.38%) was limited by a ≈1.3% abs lower FF when compared to the champion n‐type device (22.14%).…”
Section: Surface Passivation Of P‐type C‐si Wafersmentioning
confidence: 99%
See 1 more Smart Citation
“…In p‐type SHJ solar cells, surface‐related recombination affecting the low‐injection range is known to severely limit the FF of such devices. [ 74,92,107 ] This was illustrated by Descoeudres et al in 2013, where SHJ solar cells fabricated with n‐ and p‐type FZ‐Si wafers with conversion efficiencies >21% were compared. [ 107 ] In their report, despite both p‐ and n‐type devices achieving comparable peak‐ V OC values the conversion efficiency of the champion p‐type SHJ solar cell (21.38%) was limited by a ≈1.3% abs lower FF when compared to the champion n‐type device (22.14%).…”
Section: Surface Passivation Of P‐type C‐si Wafersmentioning
confidence: 99%
“…It was shown that the continuous improvements in wafer lifetime, stability, and surface passivation quality of p‐type c‐Si have enabled stable V OC values compatible with the SHJ technology. [ 48,62,74 ]…”
Section: Final Thoughtsmentioning
confidence: 99%
“…Figure displays the result of the same BO LID light‐soaking test. The V OC in the control, which is markedly lower than the defect‐engineered results displayed by Vicari Stefani, [ 86 ] displays a similar degradation profile. However, the control cell that undergoes the post‐cell AHP treatment is stable.…”
Section: Defect Engineering Approachesmentioning
confidence: 71%
“…Vicari Stefani et al investigated the impact of BO LID in p‐type SHJ cells. [ 86 ] Commercial‐grade p‐type Cz wafers, with resistivity of 1.6 Ω cm, were used to ensure that the boron concentration was similar to that used for industrial PERC solar cells. These wafers were fabricated into full‐area (244.32 cm 2 ) p‐type SHJ cells in an industrial environment at Meyer Burger, Germany.…”
Section: Defect Engineering Approachesmentioning
confidence: 99%
“…In PERC cells, the addition of such a process can have the dual impact of increasing the efficiency and improving the stability. 2,22,23 Although extensive work over the past 10 years has led to the development of hydrogenation processes in p-type technologies, 24,25 far less studies have explored the potential benefits of incorporating hydrogenation processes into the production of high-efficiency n-type passivated contact solar cells. 26 In this report, the impact of a post-cell hydrogenation process on the performance of n-type TOPCon solar cells fabricated at JinkoSolar is explored.…”
mentioning
confidence: 99%