Large Deflections of Clamped Circular Plates Under Initial Tension and Transitions to Membrane Behavior

Sheploak, M.; Dugundji, John

doi:10.1115/1.2789012

Cited by 133 publications

(131 citation statements)

References 10 publications

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“…For a transverse displacement w = w(r, θ ) and corresponding in-plane displacement u(r, θ) = u r (r, θ )e r + u θ (r, θ )e θ , expressed in terms of the usual polar coordinates (r, θ), routine manipulations, such as those presented by Sheplak & Dugundji [9], lead to nonlinear partial differential equations for the components of the membrane stress tensor and the transverse displacement. The key balances may be cast in the forms …”

Section: Development Of the Key Equationsmentioning

confidence: 99%

Asymptotic phenomena in pressurized thin films

2015

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An asymptotic study of the wrinkling of a pressurized circular thin film is performed. The corresponding boundary-value problem is described by two nondimensional parameters; a background tension μ and the applied loading P. Previous numerical studies of the same configuration have shown that P tends to be large, and this fact is exploited here in the derivation of asymptotic descriptions of the elastic bifurcation phenomena. Two limiting cases are considered; in the first, the background tension is modest, while the second deals with the situation when it is large. In both instances, it is shown how the wrinkling is confined to a relatively narrow zone near the rim of the thin film, but the mechanisms driving the bifurcation are different. In the first scenario, the wrinkles are confined to a region which, though close to the rim, is asymptotically separate from it. By contrast, when μ is larger, the wrinkling is within a zone that is attached to the rim. Predictions are made for the value of the applied loading P necessary to generate wrinkling, as well as details of the corresponding wrinkling pattern, and these asymptotic results are compared to some direct numerical simulations of the original boundary-value problem.

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Section: Development Of the Key Equationsmentioning

confidence: 99%

Asymptotic phenomena in pressurized thin films

2015

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“…It is validated using the results observed in [10] for Figure 6 shows the relative deflections w R obtained when solving the coupled ODE system for a constant SRP load at 1 AU and using hinged edge support. The central sail film deflections are in the order of 0.2% of the sail disk radius and in good agreement with the results found in [12].…”

Section: Sail Shape Control Using Variable Reflectivity Distribumentioning

confidence: 49%

“…Later in this section, variable load distributions ( ) P ξ will be used to change the nominal deflection curves of sail films subjected to constant pressure loads P , as used, for example, in microelectronics and microfluidics [10]. After the BVP has been solved for ( ) θ ξ , the vertical sail film deflection is obtained by integration from…”

Section: Sail Shape Control Using Variable Reflectivity Distribumentioning

confidence: 99%

Distributed Reflectivity Solar Sails for Extended Mission Applications

Borggräfe

Heiligers

Ceriotti

et al. 2014

Advances in Solar Sailing

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The dynamics of solar sails with a variable surface reflectivity distribution are investigated. When changing the reflectivity across the sail film, solar radiation pressure forces and torques can be controlled without changing the attitude of the spacecraft relative to the Sun or using attitude control actuators. The reflectivity can in principle be modified using electro-chromic coatings, which are applied here as examples to counteract gravity-gradient torques in Earth orbit and to enable specific shape profiles of a flexible sail film. This 'optical reconfiguration' method introduces an adaptive solar sail as a multi-functional platform for novel mission applications.

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“…In the case of a membrane, where k is the tension parameter, E the Young's modulus, h the membrane thickness, a the radius of the membrane, the transverse deflection w, as a function of radius r at an incident pressure/?, is given by [4] …”

Section: Acousto-mechanical Sensitivitymentioning

confidence: 99%

Design and Characterization of MEMS Optical Microphone for Aeroacoustic Measurement

Kadirvel

Taylor

Horowitz

et al. 2004

42nd AIAA Aerospace Sciences Meeting and Exhibit

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Public Reporting burden for this collection of information is estimated to average 1 hour per response, including the time for reviewing instructions, searching existing data sources, gathering and maintaining the data needed, and completmg and reviewing the collection of information. Send comment regarding this burden estimates or any other aspect of this collection of information, including suggestions for reducing this burden, to Washington Headquarters Services, Directorate for information Operations and Reports, 1215 Jefferson Davis Highway, Suite 1204, Arlington, VA 22202-4302, and The views, opinions and/or findings contained in this report are those of the author(s) and should not be construed as an official Department of the Army position, policy or decision, unless so designated by other documentation. This paper presents the design and characterization of an intensity modulated optical lever microphone. Optical microphones (OM) have an inherent immunity to environments hostile to electronics due to the spatial separation of the electronics and the acoustic field under test. Theoretical equations for the sensitivity, minimum detectable signal, and frequency response are presented. Physical phenomena responsible for limiting the microphone minimum detectable signal (MDS) are identified, and a model is developed for use with a laser diode as the light source. The characterization of the microphone indicates an overall sensitivity of 0.5 mV/Pa, a linear response up to 132dB ref. 20 uPa, and an overall noise floor of 70dB measured at 1kHz over a 1Hz bin. SUBJECT TERMS MEMS AbstractThis paper presents the design and characterization of an intensity modulated optical lever microphone. Optical microphones (CM) have an inherent immunity to environments hostile to electronics due to the spatial separation of the electronics and the acoustic field under test.Theoretical equations for the sensitivity, minimum detectable signal, and frequency response are presented. Physical phenomena responsible for limiting the microphone minimum detectable signal (MDS) are identified, and a model is developed for use with a laser diode as the light source.The characterization of the microphone indicates an overall sensitivity of 0.5 mV/Pa, a linear response up to 132dB ref. 20 uPa, and an overall noise floor of 70dB measured at IkHz over a IHz bin.

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Large Deflections of Clamped Circular Plates Under Initial Tension and Transitions to Membrane Behavior

Cited by 133 publications

References 10 publications

Asymptotic phenomena in pressurized thin films

Asymptotic phenomena in pressurized thin films

Distributed Reflectivity Solar Sails for Extended Mission Applications

Design and Characterization of MEMS Optical Microphone for Aeroacoustic Measurement

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