The current research on quadriwave lateral shearing interferometry
(LSI) is primarily focused on the measurements of plane wave or
quasiplane wave. When directly measuring spherical waves with high
numerical apertures (NA>0.35), it will generate additional
systematic errors, which affect measurement accuracy. To make the
quadriwave LSI applicable to the measurements of a high-NA spherical
wave, this paper proposes a fast and direct calibration method by
establishing the geometry model of the quadriwave LSI with high-NA
spherical wave incidence. The expression for the optical path
difference represented systematic errors introduced by high-NA
spherical waves in the shearing wavefronts are derived, which utilize
a ninth-order Taylor expansion and Zernike polynomials fitting to
achieve the high accuracy required by the high-NA spherical wave
incidence. Then, the systematic errors are directly calibrated in the
shearing wavefronts of four directions. This paper presents the
theoretical analysis and verifies the feasibility and reliability of
the proposed method through simulations and experiments, achieving a
good measurement accuracy.