Large field of view aberrations correction with deformable lenses and multi conjugate adaptive optics

Abstract

Optical microscopes can have limited resolution due to aberrations caused by samples and sample holders. Using deformable mirrors and wavefront sensorless optimization algorithms can correct for these aberrations, but the correction is limited to a small area of the field of view. This study presents an adaptive optics method that uses a series of plug‐and‐play deformable lenses for large field of view wavefront correction. A direct wavefront measurement method using the Spinning sub‐Pupil Aberration Measurement (SPAM) technique is combined with correction based on the deformable lenses. Experimental results using fluorescence microscopy with a wide field and a light sheet fluorescence microscope show that the proposed method can achieve detection and correction over an extended field of view with a compact transmissive module placed in the detection path of the microscope. This method could improve the resolution and accuracy of imaging in a variety of fields, including biology and materials science.This article is protected by copyright. All rights reserved.

Full-aperture extended-depth oblique plane microscopy through dynamic remote focusing

“…While this feature could be fully exploited in the presented data with the lower aperture objective, the narrow optimal axial range of ETL-based remote focusing with high aperture objectives does hinder this capability of the system, due to the appearance of non-negligible spherical aberration when focusing further from the objective’s focal plane. This position-dependent aberration could be reduced through the implementation of a more complex remote focusing method, or through the use of multi-conjugate aberration correction in the system 25 …”

“…This position-dependent aberration could be reduced through the implementation of a more complex remote focusing method, or through the use of multi-conjugate aberration correction in the system. 25 …”

“…A limit to both the resolution and frame rate performance is imposed by optical aberrations introduced by the ETL. When mounted horizontally, a conventional ETL introduces aberrations from the desired spherical phase with an RMS amplitude of less than 200 nm, which can generally be neglected in light-sheet microscopy, since typical samples often introduce more severe aberrations 25 , 26 . However, when the ETL is operated at increasing frequencies, secondary modes other than pure defocus begin to be excited, which generally introduce spherical-like aberrations.…”

“…When mounted horizontally, a conventional ETL introduces aberrations from the desired spherical phase with an RMS amplitude of less than 200 nm, which can generally be neglected in light-sheet microscopy, since typical samples often introduce more severe aberrations. 25 , 26 However, when the ETL is operated at increasing frequencies, secondary modes other than pure defocus begin to be excited, which generally introduce spherical-like aberrations. For readily available commercial ETLs, such secondary modes exhibit a resonant frequency at approximately 400 Hz, therefore precluding applications at extremely high frame rates.…”