Deposition of high-κ dielectrics onto graphene is of significant challenge due to the difficulties of nucleating high quality oxide on pristine graphene without introducing defects into the monolayer of carbon lattice. Previous efforts to deposit high-κ dielectrics on graphene often resulted in significant degradation in carrier mobility. Here we report an entirely new strategy to integrate high quality high-κ dielectrics with graphene by first synthesizing freestanding high-κ oxide nanoribbons at high temperature and then transferring them onto graphene at room temperature. We show that single crystalline Al 2 O 3 nanoribbons can be synthesized with excellent dielectric properties. Using such nanoribbons as the gate dielectrics, we have demonstrated top-gated graphene transistors with the highest carrier mobility (up to 23,600 cm 2 ∕V · s) reported to date, and a more than 10-fold increase in transconductance compared to the back-gated devices. This method opens a new avenue to integrate high-κ dielectrics on graphene with the preservation of the pristine nature of graphene and high carrier mobility, representing an important step forward to high-performance graphene electronics.graphene dielectric integration | carrier mobility | dielectric nanoribbon | nanoelectronics G raphene has attracted considerable interest as a potential electronic material due to its exceptionally high carrier mobility and tunable band gap (1-6). Various strategies have been explored to fabricate field-effect transistors based on graphene or graphene nanostructures (6-13). Most of these efforts to date employ a silicon substrate as a global back gate and silicon oxide as the gate dielectric, which have led to many interesting scientific discoveries, but will be of limited use for practical applications due to the high-gate switching voltage required and the inability to independently address individual devices on the same chip. Top-gated devices with high-κ dielectrics can significantly reduce the required switching voltage and readily allow independently addressable device arrays and functional circuits, and therefore are of significant interest (14, 15).The gate dielectric is an essential component of a transistor, which can significantly impact the critical device parameters including transconductance, subthreshold swing and frequency response. Exploring graphene for future electronics requires effective integration of high quality gate dielectrics, in particular the high-κ dielectrics. However, it has been rather challenging to deposit oxide dielectrics onto graphene without introducing defects. The deposition of high-κ dielectrics is usually achieved using atomic layer deposition (ALD), which requires reactive surface groups (16)(17)(18)(19)(20). Functionalization of graphene surface for ALD either introduces undesired impurities or breaks the chemical bonds in the graphene lattice, inevitably leading to a significant degradation in carrier mobilities (20). Physical vapor deposition (PVD) such as electron-beam evaporation or sput...