As microstructures are increasingly engineered with nanoscale precision, comparably precise metrological tools like Atom Probe Tomography (APT) are crucial for experimental validation. APT has the unique capability of 3D imaging and compositional/isotopic analysis at the subnanometer scale (Gault et al., 2021). However, the informative potential of APT is hindered by nebulous, material-dependent evaporation physics, naturally complex data analysis/visualization, and the standards/specifications set by vendors. Transparent and accessible data analysis tools are critical for reproducible analysis of APT experiments. APAV seeks to bridge the gap of openly accessible analysis tools available to scientists leveraging APT in their research.