Laser-Combined STM and Related Techniques for the Analysis of Nanoparticles/Clusters

Shigekawa, Hidemi; Yoshida, Shoji; Yoshimura, Masamichi; Mera, Yutaka

doi:10.5772/35283

Smart Nanoparticles Technology 2012

DOI: 10.5772/35283

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Laser-Combined STM and Related Techniques for the Analysis of Nanoparticles/Clusters

Hidemi Shigekawa¹,

Shoji Yoshida²,

Masamichi Yoshimura³

et al.

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Imaging of Transient Carrier Dynamics in Semiconductors by Nanoscale Pump-Probe Microscopy

Yoshida

Takeuchi

Shigekawa

2012

The Review of Laser Engineering

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We realized real space imaging of transient carrier dynamics by combining ultrashort pulse laser technology with scanning tunneling microscopy (STM). The new microscopy, called shaken-pulse-pair excited STM (SPPX-STM), simultaneously has the temporal resolution of ultrashort laser pulse width and the spatial resolution of STM. We successfully imaged carrier dynamics in semiconductors with nanoscale structures in real space by the new microscopy techniques.

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Imaging of Transient Carrier Dynamics in Semiconductors by Nanoscale Pump-Probe Microscopy

Yoshida

Takeuchi

Shigekawa

2012

The Review of Laser Engineering

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Laser-Combined STM and Related Techniques for the Analysis of Nanoparticles/Clusters

Cited by 1 publication

References 66 publications

Imaging of Transient Carrier Dynamics in Semiconductors by Nanoscale Pump-Probe Microscopy

Imaging of Transient Carrier Dynamics in Semiconductors by Nanoscale Pump-Probe Microscopy

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