Laser desorption ionization time‐of‐flight mass spectrometry of Ge‐As‐Te chalcogenides

Abstract

The local structure of Gex Asy Tez materials is at least partly different from that of species identified in plasma by mass spectrometry, as deduced from Raman scattering spectroscopy analysis. However, LDI-TOFMS was found to be a suitable technique for the partial structure characterization of Ge-As-Te bulk samples and especially for the identification of the structural motifs present in the plasma during the preparation of the corresponding thin films.

Investigation of the acousto‐optical properties of Ge–As–Te–(Se) chalcogenide glasses at 10.6 μm wavelength

“…Thus, components with high Te content have a high refractive index and M 2 . Additionally, a remarkable vibration peak appeared near the Raman shift of 190−200 cm −1 in Ge 10 As 60 Te 30 glass, which corresponds to the integration peak of the co‐edge [GeTe 4−n Ge n ] (n = 1, 2) tetrahedron structure and the symmetrically extending [As 3 ] pyramid structure 48 . The intensity of the corresponding vibration peak near 125 cm −1 decreases rapidly until it disappears completely with the gradual decrease in Te content.…”

“…Additionally, a remarkable vibration peak appeared near the Raman shift of 190−200 cm −1 in Ge 10 As 60 Te 30 glass, which corresponds to the integration peak of the co-edge [GeTe 4−n Ge n ] (n = 1, 2) tetrahedron structure and the symmetrically extending [As 3 ] pyramid structure. 48 The intensity of the corresponding vibration peak near 125 cm −1 decreases rapidly until it disappears completely with the gradual decrease in Te content. When the Te content decreases and the arsenic content further increases, the [GeTe 4 ] and [As 3 ] pyramid structures with anti-symmetric extension gradually appear and correspond to 217 cm −1 and 235 cm −1 , respectively.…”