2019 IEEE International Conference on Electrical Engineering and Photonics (EExPolytech) 2019
DOI: 10.1109/eexpolytech.2019.8906857
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Laser Frequency Noise Measurement by Forming an Interference Signal with Subcarrier Frequency

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Cited by 3 publications
(1 citation statement)
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“…For the development, we used the scattering theory described in [30]. A single-frequency semiconductor laser module with a coherence length of more than 100 m, wavelength λ = 633 nm, and radiation power of up to 10 mW was used as a radiation source [31]. The choice of the wavelength of the optical radiation source is determined from the requirement to minimize the absorption of the test solution.…”
Section: Dynamic Light Scattering Spectrometermentioning
confidence: 99%
“…For the development, we used the scattering theory described in [30]. A single-frequency semiconductor laser module with a coherence length of more than 100 m, wavelength λ = 633 nm, and radiation power of up to 10 mW was used as a radiation source [31]. The choice of the wavelength of the optical radiation source is determined from the requirement to minimize the absorption of the test solution.…”
Section: Dynamic Light Scattering Spectrometermentioning
confidence: 99%