The laser-induced crystalline disorder in silicon has attracted increasing interest due to its impact on the device performance of Si-based solar energy, optoelectronic, and electronic devices. Combined experimental and simulation approaches are effective for investigation of the fundamental mechanisms responsible for the formation of amorphous phase, polycrystalline structure, and crystal defects in the course of laser processing. In this chapter, the effects of laser pulse duration, wavelength, and fluence on the spatial distribution and concentration of point defects and dislocations, as well as the thickness and morphology of amorphous regions, are discussed based on the results of computer modeling and experiments. The laser-based thermal annealing is also considered as an effective technique for mitigating the laser-induced disorder. Overall, this chapter provides an up-to-date review of the disorder generation in laser-processed silicon and highlights the laser annealing technique for the disorder removal in silicon photovoltaic, optoelectronic, and electronic devices.