1992
DOI: 10.1143/jjap.31.3707
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Laser Spectroscopic Detection of Radicals in the Photolysis of Disilane with an ArF Laser

Abstract: Disilane (Si2H6) was photodissociated with an ArF excimer laser and the radicals produced were probed by resonantly enhanced multiphoton ionization spectroscopy (REMPI) and laser-induced fluorescence spectroscopy (LIF). Silicon and hydrogen atoms, and SiH and Si2 molecules were detected. It was found that temporal changes of the densities of Si and Si2 were controlled by diffusion in the present experiment. Absolute density calibration of the measured REMPI signals is also presented.

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Cited by 3 publications
(10 citation statements)
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“…reported the quantum yield for SiH 3 formation to be 0.05 ± 0.05 . Okada et al reported that no signal due to SiH 3 radical has been detected using the REMPI method . The results obtained in the present study are consistent with these reported results.…”
Section: Resultssupporting
confidence: 92%
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“…reported the quantum yield for SiH 3 formation to be 0.05 ± 0.05 . Okada et al reported that no signal due to SiH 3 radical has been detected using the REMPI method . The results obtained in the present study are consistent with these reported results.…”
Section: Resultssupporting
confidence: 92%
“…The quantum yield of SiH 4 formation has been estimated to be 0.1 by Chu et al There are three SiH 4 formation channels in the ground-state products as follows: Okada et al reported a quantum yield of ground-state Si( 3 P) atom formation of 0.01, from which the quantum yield of the SiH 4 + Si + H 2 channel is expected to be less than 0.01. Since the branching of reaction r12 is roughly expected to be 0.09 on the basis of the H atom yield, the sum of branching of reactions r8 and r12 is approximately equal to 0.1.…”
Section: Discussionmentioning
confidence: 99%
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