1989
DOI: 10.1016/0040-6090(89)90240-x
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Laser trimming of NiCr thin film resistors I: Thin film resistors without a protective layer

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Cited by 5 publications
(3 citation statements)
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“…Since many applications of short-pulse lasers involve interactions with microstructures, it is necessary to investigate size effects on these properties, i.e., laser trimming of thin film resistors (Schultze and Fischer, 1989) and laser damage of thin films (Guenther and Mclver, 1989). This paper presents a theoretical study of the size effects, due to both surface and grain boundary scattering, on the thermal conductivity and the electron-phonon coupling factor during nonequilibrium laser heating of metals.…”
Section: Introductionmentioning
confidence: 99%
“…Since many applications of short-pulse lasers involve interactions with microstructures, it is necessary to investigate size effects on these properties, i.e., laser trimming of thin film resistors (Schultze and Fischer, 1989) and laser damage of thin films (Guenther and Mclver, 1989). This paper presents a theoretical study of the size effects, due to both surface and grain boundary scattering, on the thermal conductivity and the electron-phonon coupling factor during nonequilibrium laser heating of metals.…”
Section: Introductionmentioning
confidence: 99%
“…manufacturing where uses span lithography [1], thin film resistor trimming [2], and thin film transistor (TFT) manufacturing (through the super-lateral growth [SLG] technique) [3,4], to name a few. Building on excimer laser acceptance, pulsed laser melting and controlled solidification of thin metal films may become a viable processing route for retention of beneficial local microstructural modifications including, but not limited to, metastable phases and nonequilibrium supersaturations.…”
mentioning
confidence: 99%
“…Reflection micrographs of film morphologies for uncapped films after flood irradiation a) Ni 100 nm on 1 µm thermal oxide at 500 mJ/cm 2 , and b) Au 100 nm on 1 µm thermal oxide at 80 mJ/cm2 Pattern analysis to determine the nature of the dewetting events[22] (nucleation vs. instability arguments) was not attempted; regardless of origin, the liquid films dewet during the laser processing.For these uncapped films, the series of flood illumination observations over a range of fluences revealed the progression from non-melting through the partial melting and complete melting thresholds. The partial melting threshold was attributed to an onset of a sudden change in color and apparent metal surface roughening.…”
mentioning
confidence: 99%