2017
DOI: 10.1016/j.precisioneng.2017.04.008
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Lateral performance evaluation of laser micromachining by high precision optical metrology and image analysis

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Cited by 5 publications
(4 citation statements)
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“…The coordinates of the calculated centres are mathematically aligned, by least-squares fitting a line to the callottes' central position, calculating the angle of the fitted line with respect to the x-axis of the reference coordinate system and rotating all the central positions based on the calculated angle, to remove errors due to fixturing and placement when setting up the artefact for the measurements. After the alignment, all centre locations from both the measurements of CMM and FVM are registered and overlapped, by translating the coordinate system of all the centre positions (from both the CMM and FVM measurements) to the centroid position of the centre location, based on their centroid locations [18]. After all the centre locations have been registered and overlapped, the errors of each centre's location on the grid are calculated as the difference between the centre locations measured with the FVM and centre locations measured with the CMM.…”
Section: Amplification and Linearity Errors In 2dmentioning
confidence: 99%
“…The coordinates of the calculated centres are mathematically aligned, by least-squares fitting a line to the callottes' central position, calculating the angle of the fitted line with respect to the x-axis of the reference coordinate system and rotating all the central positions based on the calculated angle, to remove errors due to fixturing and placement when setting up the artefact for the measurements. After the alignment, all centre locations from both the measurements of CMM and FVM are registered and overlapped, by translating the coordinate system of all the centre positions (from both the CMM and FVM measurements) to the centroid position of the centre location, based on their centroid locations [18]. After all the centre locations have been registered and overlapped, the errors of each centre's location on the grid are calculated as the difference between the centre locations measured with the FVM and centre locations measured with the CMM.…”
Section: Amplification and Linearity Errors In 2dmentioning
confidence: 99%
“…This resulted in passivation properties in the non-ablated region and bulk properties of silicon in the ablated region for solar cell applications. In another study, laser beam machining of silicon wafers was attempted by Daemi et al to study the precision of micromachining of the machines [12]. Furthermore, the removal of fragile silicon substrate was also tried to achieve a freestanding micromachined structure.…”
Section: Introductionmentioning
confidence: 99%
“…Micromachining is generally defined as the machining process that produces miniature component or feature in of the range of 1µm to 999 µm [9]. Several non-conventional methods such as micro electric discharge machining (µEDM) [10][11][12], laser micromachining [13,14], ultrasonic [15][16][17], electron beam machining (EBM) [18,19], etc. are mostly used to produce miniaturized product/feature this range.…”
Section: Introductionmentioning
confidence: 99%