1998
DOI: 10.1063/1.367437
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Lateral periodicity and elastic stress relaxation in GaInAsP quantum wires on InP investigated by x-ray diffractometry

Abstract: Synchrotron x-ray diffractometry has been used to investigate GaInAsP quantum wire structures on InP with a quantum well layer between the substrate and the wire. The lateral periodicity was determined with high accuracy. An elastic stress relaxation, which occurs near the free surface of the sidewalls, was observed. It results in deformation gradients in the wires, which influence the distribution of the diffracted intensity in reciprocal space.

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Cited by 3 publications
(4 citation statements)
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“…A semi-quantitative agreement of the observed diffraction patterns with the kinematical calculations is obtained. The small shifts of the PL lines in the free standing structures correspond roughly to the expected value [15]. The remaining difference between the calculated elastic contribution E g (calc.)…”
Section: Discussionsupporting
confidence: 68%
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“…A semi-quantitative agreement of the observed diffraction patterns with the kinematical calculations is obtained. The small shifts of the PL lines in the free standing structures correspond roughly to the expected value [15]. The remaining difference between the calculated elastic contribution E g (calc.)…”
Section: Discussionsupporting
confidence: 68%
“…The diffraction of x-rays by a quantum wire array can be described in first approximation in the kinematical limit in analogy to the Bragg diffraction from an atomic lattice [15,18]. The superstructure along the surface together with the truncation of the sample at the surface [19] leads to grating truncation rods (GTR).…”
Section: Resultsmentioning
confidence: 99%
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