2012 International Conference on Devices, Circuits and Systems (ICDCS) 2012
DOI: 10.1109/icdcsyst.2012.6188722
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Laterally-asymmetric-channel-insulated-shallow-extension-silicon-on-nothing LAC-ISE-SON MOSFET for improved reliability and digital circuit simulation

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(1 citation statement)
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“…The reduction in electron temperature at the drain side is only because of the presence of side pillars. The gate and substrate leakage current are also suppressed in case of ISE-SON architecture as compared to other devices [7]. Although, the suitability of the ISE-SON for analog applications has been discussed in detailed [4,5] but suitability for low-voltage digital application is still not discussed.…”
Section: Introductionmentioning
confidence: 98%
“…The reduction in electron temperature at the drain side is only because of the presence of side pillars. The gate and substrate leakage current are also suppressed in case of ISE-SON architecture as compared to other devices [7]. Although, the suitability of the ISE-SON for analog applications has been discussed in detailed [4,5] but suitability for low-voltage digital application is still not discussed.…”
Section: Introductionmentioning
confidence: 98%