2014
DOI: 10.1111/jace.13126
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Lattice and Grain‐Boundary Diffusion of Al in Tetragonal Yttria‐Stabilized Zirconia Polycrystalline Ceramics (3Y‐TZP) Analyzed Using SIMS

Abstract: Aluminum oxide was deposited on the surface of 3 mol% yttria‐stabilized tetragonal zirconia polycrystals (3Y‐TZP). The samples were annealed at temperatures from 1523 to 1773 K. Diffusion profiles of Al in the form of mean concentration vs. depth in B‐type kinetic region were investigated by secondary ion mass spectroscopy. The experimental results for the lattice diffusion (DB) and grain boundary diffusion (DGB) are as follows: normalDnormalB=6.5×105exp−590kJmolRTfalse[cm2sfalse] and DGBboldδs=2.6×105exp−675k… Show more

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Cited by 6 publications
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“…In any cases diffusion, involving both lattice and grain boundary data are needed to verification of proposed mechanisms. Recently used secondary ion mass spectrometry (SIMS) is suitable for this purpose [73,[76][77][78].…”
Section: Discussionmentioning
confidence: 99%
“…In any cases diffusion, involving both lattice and grain boundary data are needed to verification of proposed mechanisms. Recently used secondary ion mass spectrometry (SIMS) is suitable for this purpose [73,[76][77][78].…”
Section: Discussionmentioning
confidence: 99%