Lattice distortion energy spectra of thin evaporated silver films

Schumacher, Dieter; Stark, D.

doi:10.1016/0040-6090(86)90045-3

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1987

2007

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Cited by 6 publications

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“…The healing of lattice distortions has been extensively discussed in a paper of Schumacher and Stark [7]. These authors applied Vand's theory [8] with good success.…”

mentioning

confidence: 99%

The Effect of Annealing on the Electrical Resistivity of Thin Silver Films

Wißmann¹,

Finzel²

2007

Springer Tracts in Modern Physics

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“…The healing of lattice distortions has been extensively discussed in a paper of Schumacher and Stark [7]. These authors applied Vand's theory [8] with good success.…”

mentioning

confidence: 99%

The Effect of Annealing on the Electrical Resistivity of Thin Silver Films

Wißmann¹,

Finzel²

2007

Springer Tracts in Modern Physics

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Structural and electrical properties of thin d.c. magnetron‐sputtered gold films deposited on float glass

Märkert

Lützenkirchen‐Hecht

Frahm

2006

Surface & Interface Analysis

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The combination of in situ electrical resistivity measurements and ex situ tapping-mode atomic force microscopy (AFM) in air was used to study the surface topography and the electrical properties of thin d.c. magnetron-sputtered gold films on float glass substrates. In particular, the influence of the deposition temperature and a subsequent isochronous annealing process on the electrical resistivity and the surface structure of the polycrystalline gold films were analysed. The results show that a minimum surface roughness of about 0.4 nm was achieved for a deposition temperature of about 350 K. After the annealing process, an increase of the surface roughness and the lateral crystallite size was observed in general, suggesting that the measured decrease in resistivity during annealing is not related to a smoothing of the surface, but to the decrease of the grain-boundary scattering of the conduction electrons. Assuming that the annealing processes are diffusion-limited reactions, we calculated the corresponding activation energies from the irreversible branch of the annealing curves, yielding values of about 0.6-1.0 eV, which also correspond to grain-boundary diffusion.

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New evidence for the validity of the Fuchs-Sondheimer theory

Schumacher

1987

Thin Solid Films

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Lattice distortion energy spectra of thin evaporated silver films

Cited by 6 publications

References 13 publications

The Effect of Annealing on the Electrical Resistivity of Thin Silver Films

The Effect of Annealing on the Electrical Resistivity of Thin Silver Films

Structural and electrical properties of thin d.c. magnetron‐sputtered gold films deposited on float glass

New evidence for the validity of the Fuchs-Sondheimer theory

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