1978
DOI: 10.1007/bf03182147
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Lattice imaging by high resolution electron microscopy: The role of high resolution electron microscopy in solid state chemistry

Abstract: The lattice imaging technique of high resolution electron microscopy has emerged to be a powerful method for investigating ultramicrostructures of crystals at the unit cell level. This technique can indeed be considered to be crystallography in real space. In this article, the principles and applicability of lattice imaging have been discussed along with a variety of applications. The applications discussed include the study of structures of solids, defects and dislocations, topochemistry of solid state reacti… Show more

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Cited by 8 publications
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“…Transmission electron microscopy (TEM) is closely related to SEM, but substantially different information can be garnered through these complementary forms of electron microscopy. While SEM provides information about the surface of a sample, TEM is used to investigate the internal structure of a material with subnanometer resolution . In addition to its imaging capability, TEM also outputs diffraction information, which can be used to determine crystallinity, phase, and grain size in a small sample. , Excellent Z-contrast is generally observed for actinide- and lanthanide-containing samples due to the large electron clouds and highly charged nuclei of these elements, , making TEM a powerful form of characterization for nuclear materials.…”
Section: Microanalytical Techniquesmentioning
confidence: 99%
“…Transmission electron microscopy (TEM) is closely related to SEM, but substantially different information can be garnered through these complementary forms of electron microscopy. While SEM provides information about the surface of a sample, TEM is used to investigate the internal structure of a material with subnanometer resolution . In addition to its imaging capability, TEM also outputs diffraction information, which can be used to determine crystallinity, phase, and grain size in a small sample. , Excellent Z-contrast is generally observed for actinide- and lanthanide-containing samples due to the large electron clouds and highly charged nuclei of these elements, , making TEM a powerful form of characterization for nuclear materials.…”
Section: Microanalytical Techniquesmentioning
confidence: 99%