“…Transmission electron microscopy (TEM) is closely related to SEM, but substantially different information can be garnered through these complementary forms of electron microscopy. While SEM provides information about the surface of a sample, TEM is used to investigate the internal structure of a material with subnanometer resolution . In addition to its imaging capability, TEM also outputs diffraction information, which can be used to determine crystallinity, phase, and grain size in a small sample. , Excellent Z-contrast is generally observed for actinide- and lanthanide-containing samples due to the large electron clouds and highly charged nuclei of these elements, , making TEM a powerful form of characterization for nuclear materials.…”