In
this work, the micro-photoluminescence (PL) technique is applied
to study the thermal transport properties of single-layer transition-metal
dichalcogenide materials WS2 grown by chemical vapor deposition.
By comparing the temperature-dependent Raman spectrum with the PL
spectrum, we prove that the PL implementation can provide both higher
temperature sensitivity (4–5 times) and stronger signal response
(∼100 times), which may largely reduce the uncertainties and
time consumption for thermal conductivity measurements. By use of
temperature- and power-dependent PL measurements, the in-plane thermal
conductivity of the suspended single-layer WS2 is derived
as ∼63 ± 7 W/m·K. Moreover, by examining the power-dependent
PL response of the SiO2/Si substrate-supported single-layer
WS2 using different sizes of laser spot radius, the thermal
conductivity κ and the interface thermal conductance g of the supported single-layer WS2 are determined
as ∼32.8 ± 3.8 W/m·K and 4.4 ± 0.4 KW/m2·K simultaneously, respectively. Our research demonstrates
that the micro-PL approach can be an effective contactless way to
investigate the thermal transport properties of single- and few-layer
TMDC materials.