2015
DOI: 10.1063/1.4913359
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Layer resolved magnetic domain imaging of epitaxial heterostructures in large applied magnetic fields

Abstract: We use X-ray Excited Luminescence Microscopy to investigate the elemental and layer resolved magnetic reversal in an interlayer exchange coupled (IEC) epitaxial Fe/Cr wedge/Co heterostructure. The transition from strongly coupled parallel Co-Fe reversal for Cr thickness tCr < 0.34 nm to weakly coupled layer independent reversal for tCr > 1.5 nm is punctuated at 0.34 < tCr < 1.5 nm by a combination of IEC guided domain wall motion and stationary zig zag domain walls. Domain walls nuc… Show more

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Cited by 3 publications
(3 citation statements)
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“…The introduction of the second energy scale, that of the RKKY coupling, leads to the changes in the domain pattern [11], [20]. The extracted interlayer coupling is given in figure 4(a).…”
Section: Magnetic Measurements and Discussionmentioning
confidence: 99%
See 1 more Smart Citation
“…The introduction of the second energy scale, that of the RKKY coupling, leads to the changes in the domain pattern [11], [20]. The extracted interlayer coupling is given in figure 4(a).…”
Section: Magnetic Measurements and Discussionmentioning
confidence: 99%
“…The two notable changes in the domain pattern with the onset of the RKKY coupling (see figure 3) are the formation of a well-defined front and the significant reduction in the amplitude of the domains. This is driven by the energy gradient associated with the spatially varying RKKY coupling [20]. Greater energy is required for the wall to deviate further up the wedge leading to small amplitude zigzag domains on a well-defined line.…”
Section: Magnetic Measurements and Discussionmentioning
confidence: 99%
“…Synchrotron X-ray technology has shed light on a diverse array of fields extending from structural biology (Rasmussen et al, 2007;Appelt et al, 1981) and geology (Wenk et al, 2000) to condensed matter (Mannini et al, 2009;Bailey et al, 2013;Rosenberg et al, 2012;Zohar et al, 2015) and chemistry (Qiao et al, 2011;de Smit et al, 2008). In recent years, interest in nanoscale phenomena has motivated significant effort to focus X-ray beams well below the micrometer level (Mimura et al, 2009).…”
Section: Introductionmentioning
confidence: 99%