“…In studies of Ge nanocrystals on Si, the topography of nanocrystals and their evolution in size and shape were extensively investigated by various methods such as atomic force microscopy [1], transmission electron microscopy (TEM) [2], low-energy electron microscopy [3], and grazing incidence small angle X-ray scattering [4]. On the other hand, scanning tunneling microscopy (STM) studies [5][6][7] yielded the surface periodic structures of the Ge/Si(1 0 0) nanocrystal including the {1 0 5} facet, which is tilted by a slope angle of 11.3°f rom the substrate plane. However, the steeper the slope angle of facet surfaces, the more difficult in observation of the surface structure of the facets.…”