2013
DOI: 10.1016/j.procir.2013.05.059
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Learning Defect Classifiers for Textured Surfaces Using Neural Networks and Statistical Feature Representations

Abstract: Detecting surface defects is a challenging visual recognition problem arising in many processing steps during manufacturing. These defects occur with arbitrary size, shape and orientation. The challenges posed by this complexity have been combated with very special, runtime intensive and hand-designed feature representations. In this paper we present a machine vision system which uses basic patch statistics from raw image data combined with a two layer neural network to detect surface defects on arbitrary text… Show more

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Cited by 40 publications
(15 citation statements)
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“…The focus is primarily on deep-learning methods that have, in recent years, become the most common approach in the field of computer vision. When applied to the problem of surface-quality control (Chen and Ho 2016;Faghih-Roohi et al 2016;Weimer et al 2013;Kuo et al 2014), deeplearning methods can achieve excellent results and can be adapted to different products. Compared to classical machinevision methods, the deep learning can directly learn features from low-level data, and has higher capacity to represent complex structures, thus completely replacing handengineering of features with automated learning process.…”
Section: Introductionmentioning
confidence: 99%
“…The focus is primarily on deep-learning methods that have, in recent years, become the most common approach in the field of computer vision. When applied to the problem of surface-quality control (Chen and Ho 2016;Faghih-Roohi et al 2016;Weimer et al 2013;Kuo et al 2014), deeplearning methods can achieve excellent results and can be adapted to different products. Compared to classical machinevision methods, the deep learning can directly learn features from low-level data, and has higher capacity to represent complex structures, thus completely replacing handengineering of features with automated learning process.…”
Section: Introductionmentioning
confidence: 99%
“…Therefore, non-maximum suppression technique is used. Figure 2 displays an overall Defect detection framework [22].…”
Section: Defect Detection Methodsmentioning
confidence: 99%
“…Learning procedure with patch extraction and feature representation[22] Number of patches p with size s is used for learning instead of using the whole image, as shown inFigure 2, In the first stage random patches are generated, in the second stage patch layoutis displayed, where each image patch shows a row vector and at last features are represented. Remember that (x i ,y i ) represents the i th example of learning with 1 and 0 for defected and non-defected pictures respectively.…”
mentioning
confidence: 99%
“…These extracted features are sometimes specific to a particular product and may need to be manually adapted to different products. 16 On the other hand, CNN-based deep learning image analytics hold the potential to be quickly adapted to a new product and do not have limitations for a large-scale inspection, which is necessary for industries to generalize these methods into the production line rapidly. 9 CNNs can directly learn features from complex structures and are capable of being adapted to a new product, 17 thereby holding the potential to replace handcrafted feature-based learning programs with automated processes.…”
Section: Introductionmentioning
confidence: 99%