The website www.wiley.com/go/statistical_pattern_recognition contains supplementary material on topics including measures of dissimilarity, estimation, linear algebra, data analysis and basic probability.xxii PREFACE who have provided encouragement and made comments on various parts of the manuscript. In particular, we would like to thank Anna Skeoch for providing figures for Chapter 12; and Richard Davies and colleagues at John Wiley for help in the final production of the manuscript. Andrew Webb is especially thankful to Rosemary for her love, support and patience.