2017
DOI: 10.1557/jmr.2017.45
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Length-dependent melting behavior of Sn nanowires

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Cited by 10 publications
(6 citation statements)
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References 25 publications
(24 reference statements)
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“…Some regular structure was found and its lattice spacing is corresponded to the (101) plane of Sn . Since the melting point of pure Sn is 232 °C and the electrode precursor was treated at 320 °C, indicating that some Sn was melted and seeped into carbon substrate . The Energy Disperse Spectroscopy (EDS) element mapping profile of the integrated SnO x /carbon electrode indicates that the SnO x particles were distributed evenly in the carbon (Figure c, d, e, f).…”
Section: Resultsmentioning
confidence: 97%
“…Some regular structure was found and its lattice spacing is corresponded to the (101) plane of Sn . Since the melting point of pure Sn is 232 °C and the electrode precursor was treated at 320 °C, indicating that some Sn was melted and seeped into carbon substrate . The Energy Disperse Spectroscopy (EDS) element mapping profile of the integrated SnO x /carbon electrode indicates that the SnO x particles were distributed evenly in the carbon (Figure c, d, e, f).…”
Section: Resultsmentioning
confidence: 97%
“…We nd a slight increase in the thickness of the SnO x layer aer heat treatment (135 ± 3 nm), which is likely due to the volume expansion of the SnO x upon heat treatment. 28,29 The annealing temperature was chosen to avoid changes in the contact angles of H 2 O on the annealed GDL surfaces to ensure no structural changes on the GDL during heat treatment (Fig. S5 †).…”
Section: Resultsmentioning
confidence: 99%
“…A direct heating in furnace to provide precise temperature control, has been used to study the reflow performance of NS [25], however, in situ visual observation is not available. In situ TEM equipped with a heating holder can precisely control the temperature exerted on the nanomaterials combined with the overall system stability to image, therefore providing an in situ dynamic observation of the NS morphological evolution during heating [26][27][28]. Using this method, Yin et al have studied the length-dependent melting behavior of Sn nanowires, indicating that the melting induced their morphological evolution to change with the length/width aspect ratio [27].…”
Section: Introductionmentioning
confidence: 99%