“…As described in the previous paper [13], the diffraction pattern of each aperture in the detector plane is isolated approximately from those of the adjoining square if the parameters of the measurement system (i.e., z, l, w and d) satisfy a condition d1 l∕z > ε2λl∕w lσ j ∕z, (j u, v), where d1 l∕z denotes the array's period in the detector plane given from the geometrical optics prediction for the wave propagation from the small object, 2λl∕w lσ j ∕z(in which σ j is the extent of the object function in the direction of u or v) represents the main width of the diffraction pattern of each square aperture in the case of the far-field diffraction, and ε indicates a safety factor larger than unity for increase of the main width due to the phase variation of the wavefront inside each aperture. Note that this is not a necessary condition but a sufficient one.…”