LET spectra of proton energy levels from 50 to 500 MeV and their effectiveness for single event effects characterization of microelectronics

Hiemstra, David M.; Blackmore, E. W.

doi:10.1109/tns.2003.821811

Cited by 70 publications

(47 citation statements)

References 10 publications

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“…Protons interact with Si nuclei generating showers of light fragments and recoiling heavy ions [1][2][3]. The light fragments of the reaction products are seen to produce LET of less than 1.5 MeV-cm 2 /mg [2].…”

Section: Calculation and Discussionmentioning

confidence: 99%

“…where N 1 is the concentration of Si, which is 5 6 10 22 / cm 3 and d Si is the Si thickness of 0.15 mm.…”

Section: Proton Induced Seu Cross Section Predictionmentioning

confidence: 99%

“…Protons have very small ''linear energy transfer (LET)'' in Si and they can generate showers of light fragments and recoiling heavy ions when interacting with Si nuclei [1][2][3]. The light fragments from this reaction are seen to produce LET of less than 1.5 MeVcm 2 /mg [2], while the heavier recoil particles (nitrogen to silicon) -the remaining silicon nucleus following the cascade and evaporation stages -produce LET of 1.5-14 MeV-cm 2 /mg [2,4].…”

Section: Introductionmentioning

confidence: 99%

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Proton induced single event upset cross section prediction for 0.15 μm six-transistor (6T) silicon-on-insulator static random access memories

Li¹,

Zhou²,

Liu³

2012

Journal of Nuclear Science and Technology

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In this paper, an efficient physics-based method to estimate the saturated proton upset cross section for six-transistor (6T) silicon-on-insulator (SOI) static random access memory (SRAM) cells using layout and technology parameters is proposed. This method calculates the effects of radiation based on device physics. The simple method handles the problem with ease by SPICE simulations, which can be divided into two stages. At first, it uses a standard SPICE program to predict the cross section for recoiling heavy ions with linear energy transfer (LET) of 14 MeV-cm 2 /mg. Then, the predicted cross section for recoiling heavy ions with LET of 14 MeV-cm 2 /mg is used to estimate the saturated proton upset cross section for 6T SOI SRAM cells with a simple model. The calculated proton induced upset cross section based on this method is in good agreement with the test results of 6T SOI SRAM cells processed using 0.15 mm technology.

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Section: Calculation and Discussionmentioning

confidence: 99%

“…where N 1 is the concentration of Si, which is 5 6 10 22 / cm 3 and d Si is the Si thickness of 0.15 mm.…”

Section: Proton Induced Seu Cross Section Predictionmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

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Proton induced single event upset cross section prediction for 0.15 μm six-transistor (6T) silicon-on-insulator static random access memories

Li¹,

Zhou²,

Liu³

2012

Journal of Nuclear Science and Technology

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“…According to studies from the manufacturer, SEL have been observed at linear energy transfer (LET) levels of 86.9 MeV cm 2 /mg and higher at room temperature and at an operating temperature of 125 • C [45]; another study [44] has observed SEL at LET levels of 55 MeV cm 2 /mg and higher. The typical LET for nuclear interaction in silicon, by far the most abundant material around the sensitive nodes of the chip, is around 16 MeV cm 2 /mg [46] which is far below the thresholds observed to cause SEL. However, there are other materials in the chip that can lead to recoils with larger LET.…”

Section: Front-end Fpgasmentioning

confidence: 91%

CMS Technical Design Report for the Phase 1 Upgrade of the Hadron Calorimeter

Mans¹

2012

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This report describes the technical design and outlines the expected performance of the Phase 1 Upgrade of the CMS Hadron Calorimeters. The upgrade is designed to improve the performance of the calorimeters at high luminosity with large numbers of pileup events by increasing the depth-segmentation of the calorimeter and providing new capabilities for anomalous background rejection. The photodetectors of the CMS Barrel and Endcap Hadron Calorimeters, currently hybrid photodiodes (HPDs), will be replaced by silicon photomultiplier (SiPM) devices. The single-channel phototubes of the Forward Hadron Calorimeter will be replaced by multi-anode phototubes operated in a dual-anode configuration. The readout electronics for all three calorimeter systems will also be replaced. A new charge-integrating ADC, the QIE10, with an integrated TDC will be used along with a 4.8 Gbps data-link. The off-detector electronics will also be substantially upgraded to handle higher data volumes and improve the information sent to the calorimeter trigger system. The expected performance of these upgrades is discussed, including a detailed study of several Higgs and SUSY analyses. The planning for the implementation of this upgrade is presented, including construction, testing, and installation. AcknowledgmentsWe would like to thank the technical staff from the various institutions for the design, R&D and testing of the many components of this upgrade.We also wish to thank the LHCC for their oversight and crucial advice during the development of the HCAL Phase 1 upgrade project. We also acknowledge the warm support received from the CMS management team. The important feedback from following CMS internal reviewers greatly helped in the development of this technical design report: Finally, we dedicate this technical design report for the phase 1 upgrade of the HCAL subdetectors to the memory of our colleague

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“…This energy is above the maximum recommended in the JEDEC standard (150 MeV) and from a nuclear reaction point of view is considered to be an energy for which SEE cross sections in silicon are saturated [22], [23].…”

Section: A Saturated Cross Sections At 230 Mevmentioning

confidence: 93%

SEL Hardness Assurance in a Mixed Radiation Field

Alía

Brügger

Danzeca

et al. 2015

IEEE Trans. Nucl. Sci.

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This paper explores the relationship between monoenergetic and mixed-field Single Event Latchup (SEL) cross sections, concluding that for components with a very strong energy dependence and highly-energetic environments, test results from monoenergetic or soft mixed-field spectra can significantly underestimate the operational failure rate. We introduce a semi-empirical approach that can be used to evaluate the SEL rate for such environments based on monoenergetic measurements and information or assumptions on the respective sensitive volume and materials surrounding it. We show that the presence of high-Z materials such as tungsten is particularly important in determining the hadron cross section energy dependence for components with relatively large LET thresholds. Abstract-This paper explores the relationship between monoenergetic and mixed-field Single Event Latchup (SEL) cross sections, concluding that for components with a very strong energy dependence and highly-energetic environments, test results from monoenergetic or soft mixed-field spectra can significantly underestimate the operational failure rate. We introduce a semiempirical approach that can be used to evaluate the SEL rate for such environments based on monoenergetic measurements and information or assumptions on the respective sensitive volume and materials surrounding it. We show that the presence of high-Z materials such as tungsten is particularly important in determining the hadron cross section energy dependence for components with relatively large LET thresholds.

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LET spectra of proton energy levels from 50 to 500 MeV and their effectiveness for single event effects characterization of microelectronics

Cited by 70 publications

References 10 publications

Proton induced single event upset cross section prediction for 0.15 μm six-transistor (6T) silicon-on-insulator static random access memories

Proton induced single event upset cross section prediction for 0.15 μm six-transistor (6T) silicon-on-insulator static random access memories

CMS Technical Design Report for the Phase 1 Upgrade of the Hadron Calorimeter

SEL Hardness Assurance in a Mixed Radiation Field

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