Life testing plan for electronic components based on design of experiments

Kobi, Abdessamad; Indmeskine, Fatima-Ezahra; Saintis, Laurent

doi:10.1016/b978-0-443-13242-1.00012-6

Developments in Reliability Engineering 2024

DOI: 10.1016/b978-0-443-13242-1.00012-6

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Life testing plan for electronic components based on design of experiments

Abdessamad Kobi,

Fatima-Ezahra Indmeskine,

Laurent Saintis

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Life testing plan for electronic components based on design of experiments

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