2018
DOI: 10.1109/tia.2017.2753722
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Lifetime Estimation of Discrete IGBT Devices Based on Gaussian Process

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Cited by 75 publications
(48 citation statements)
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“…While the training dataset in kernel methods is kept and used in the testing stage, and the learned knowledge is facilitated as the identification of critical data points (e.g., support vectors in support vector machine [126]) or subset in the training dataset. One typical kernel method is Gaussian processes, which has been applied to the remaining useful life prediction of IGBTs in [119]. Note that the conventional kernel methods (e.g., Gaussian processes) are computationally intensive due to the whole training dataset is applied to the testing stage.…”
Section: Machine Learningmentioning
confidence: 99%
See 1 more Smart Citation
“…While the training dataset in kernel methods is kept and used in the testing stage, and the learned knowledge is facilitated as the identification of critical data points (e.g., support vectors in support vector machine [126]) or subset in the training dataset. One typical kernel method is Gaussian processes, which has been applied to the remaining useful life prediction of IGBTs in [119]. Note that the conventional kernel methods (e.g., Gaussian processes) are computationally intensive due to the whole training dataset is applied to the testing stage.…”
Section: Machine Learningmentioning
confidence: 99%
“…In [119], Gaussian processes regression is applied to the RUL prediction of IGBTs. For the degradation modeling, the nonlinear relationship between the decrement of on-state collector-emitter voltage ∆V ce,on and the condition monitoring time is established by the Gaussian processes regression.…”
Section: Remaining Useful Life Predictionmentioning
confidence: 99%
“…The interfacing voltage and flowing current of the RSC are heavily dependent on the inherent parameters of the DFIG. Neglecting the stator resistance and the rotor resistance, and together with the help of DFIG modeling in the dq reference frame [9], the relationship between the rotor-side voltage ur and current ir and the stator-side voltage us and current is are,…”
Section: Electrical Stresses and Selected Power Devicesmentioning
confidence: 99%
“…The stress is related to the environmental loads (like thermal, mechanical, humidity, etc. ), or the functional loads (such as user profiles, electrical operation) [9]- [12]. On the other hand, the strength means the ability to endure such stressors before fatigue occurs (e.g.…”
Section: Introductionmentioning
confidence: 99%
“…For example, Mukhopadhyay et al proposed a Bayesian method for reliability estimation using multi‐stress accelerated life testing of series systems. Ali et al combined Gaussian process modeling and Bayesian inference method to estimate the remaining useful life of insulated‐gate bipolar transistor devices.…”
Section: Introductionmentioning
confidence: 99%