2013
DOI: 10.1007/978-94-007-5863-6_9
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Light Extraction Efficiency Part A. Ray Tracing for Light Extraction Efficiency (LEE) Modeling in Nitride LEDs

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Cited by 14 publications
(8 citation statements)
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“…The roughening improves LEE by reducing the effective refractive index of AlN 79 and results in favorable scattering geometries for light extraction. 80 Figure 3a compares the EQE as a function of current density between a UV LED on SiC substrate, as a reference (Figure 3b); a smooth TFFC UV LED before roughening (Figure 3c); and a KOH-roughened TFFC LED (Figure 3d). Direct estimate of the LEE in smooth and submicron roughened thin-film LEDs is challenging due to the wave nature of light, subwavelength structures, and coherence effects, such as interference and diffraction.…”
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confidence: 99%
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“…The roughening improves LEE by reducing the effective refractive index of AlN 79 and results in favorable scattering geometries for light extraction. 80 Figure 3a compares the EQE as a function of current density between a UV LED on SiC substrate, as a reference (Figure 3b); a smooth TFFC UV LED before roughening (Figure 3c); and a KOH-roughened TFFC LED (Figure 3d). Direct estimate of the LEE in smooth and submicron roughened thin-film LEDs is challenging due to the wave nature of light, subwavelength structures, and coherence effects, such as interference and diffraction.…”
mentioning
confidence: 99%
“…KOH roughening of nitrogen-polar AlN exposes facets defined by {101̅1̅}, forming random hexagonal pyramids (SEM of submicron roughening is shown in the inset in Figure ; AlN pyramids diagonal length was ∼190–160 nm). The roughening improves LEE by reducing the effective refractive index of AlN and results in favorable scattering geometries for light extraction …”
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confidence: 99%
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“…The proposed solution is to use ray tracing method. This method is well known and used, including the bulk optics systems (Horiuchi et al 2010) and for analysis the light extraction efficiency of LEDs (Borbely and Johnson 2004;Lalau Keraly et al 2013;Zang et al 2016). The ray tracing method based on the geometrical optics allows to determine of the route travelled by the ray from the moment of launch, by using the Snell's law.…”
Section: Introductionmentioning
confidence: 99%
“…Standard raytracing is often employed to model C ex . [6][7][8][9][10][11] In our case, however, this is not fully warranted: we employ small-scale ($1 lm) surface roughness (SR) to randomize photon trajectories, [12][13][14] and ray optics do not necessarily apply in such a regime. 4,15,16 Rather, as discussed in Ref.…”
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confidence: 97%