Light-Induced Charge Carrier Dynamics at Nanostructured Interfaces Investigated by Ultrafast Electron Diffractive Photovoltammetry

Chang, KyungHi; Murdick, Ryan A.; Han, Tzong-Ru T.; Yuan, Fei; Ruan, Chong‐Yu

doi:10.1007/978-1-4614-8148-5_13

Cited by 2 publications

References 106 publications

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The Many Facets of Ultrafast Electron Diffraction and Microscopy: Development and Applications

Ruan

2023

Structural Dynamics With X-Ray and Electron Scattering

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In the past two decades, the rapid pace in the development of table-top ultrafast electron diffraction and microscopy instrumentation has ushered in a new area of investigating structural dynamics and related material property responses. In this chapter, we will review the multifaceted development involving gas-phase ultrafast electron diffraction for investigating photochemistry (gas phase UED), surface-sensitive ultrafast electron nanocrystallography (UEnC) and ultrafast photovoltamnetry (UPV) for probing subsurfaces, surfaces, and supported nanoparticles, as well as ultrafast electron crystallography (UEC) for the studies of molecular crystals and quantum materials. Prototypical examples of data collections, core technologies, and specialized protocols for structure analysis are presented in some detail with the hope that they can be reproduced by interested readers in their own studies. The need to simultaneously obtain information about the electronic states, functionalities, as well as structure dynamics motivates the development of ultrafast electron microscopy (UEM) in which diffraction, imaging, and spectroscopy are united to enable multimodality observations on ultrafast timescales for a broad range of materials science problems. The second part of the chapter covers the latest UEM technologies supported by new developments in generating high-brightness electron bunches, and the RF-based techniques for phase-space manipulations. Based on current progress, frank assessments about the performance in different areas and limitations are provided.

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The Many Facets of Ultrafast Electron Diffraction and Microscopy: Development and Applications

Ruan

2023

Structural Dynamics With X-Ray and Electron Scattering

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100 years of the physics of diodes

Zhang

Valfells

Ang

et al. 2017

Applied Physics Reviews

192

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The Child-Langmuir Law (CL), discovered a century ago, gives the maximum current that can be transported across a planar diode in the steady state. As a quintessential example of the impact of space charge shielding near a charged surface, it is central to the studies of high current diodes, such as high power microwave sources, vacuum microelectronics, electron and ion sources, and high current drivers used in high energy density physics experiments. CL remains a touchstone of fundamental sheath physics, including contemporary studies of nanoscale quantum diodes and nano gap based plasmonic devices. Its solid state analog is the Mott-Gurney law, governing the maximum charge injection in solids, such as organic materials and other dielectrics, which is important to energy devices, such as solar cells and light emitting diodes. This paper reviews the important advances in the physics of diodes since the discovery of CL, including virtual cathode formation and extension of CL to multiple dimensions, to the quantum regime, and to ultrafast processes. We review the influence of magnetic fields, multiple species in bipolar flow, electromagnetic and time dependent effects in both short pulse and high frequency THz limits, and single electron regimes. Transitions from various emission mechanisms (thermionic-, field-, and photoemission) to the space charge limited state (CL) will be addressed, especially highlighting the important simulation and experimental developments in selected contemporary areas of study. We stress the fundamental physical links between the physics of beams to limiting currents in other areas, such as low temperature plasmas, laser plasmas, and space propulsion.

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Light-Induced Charge Carrier Dynamics at Nanostructured Interfaces Investigated by Ultrafast Electron Diffractive Photovoltammetry

Cited by 2 publications

References 106 publications

The Many Facets of Ultrafast Electron Diffraction and Microscopy: Development and Applications

The Many Facets of Ultrafast Electron Diffraction and Microscopy: Development and Applications

100 years of the physics of diodes

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