1957
DOI: 10.1080/00207215708937060
|View full text |Cite
|
Sign up to set email alerts
|

LIII. The Examination of p-n Junctions with the Scanning Electron Microscope†

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1
1
1

Citation Types

1
25
0

Year Published

1972
1972
2022
2022

Publication Types

Select...
6
2
1

Relationship

0
9

Authors

Journals

citations
Cited by 58 publications
(26 citation statements)
references
References 1 publication
1
25
0
Order By: Relevance
“…Although the percolation threshold is known to be affected by various factors, e.g. aspect ratio of CNTs [35,36], CNT waviness [37][38][39], processing conditions [40][41][42], the obtained results clearly demonstrate the potential of the aqueous film former systems for the deposition of CNT networks on GF.…”
Section: Modification Of the Polymeric Film Former System By Dispersementioning
confidence: 72%
See 1 more Smart Citation
“…Although the percolation threshold is known to be affected by various factors, e.g. aspect ratio of CNTs [35,36], CNT waviness [37][38][39], processing conditions [40][41][42], the obtained results clearly demonstrate the potential of the aqueous film former systems for the deposition of CNT networks on GF.…”
Section: Modification Of the Polymeric Film Former System By Dispersementioning
confidence: 72%
“…After the annealing CNTs can hardly be observed sticking out the PP film on the GF. However, charge contrast imaging [42][43][44][45] enables one to derive information about the distribution of CNTs within the outermost layer of nanocomposites. Figure 3d Whenever a single GF fails or the interfacial shear stress exceeds a critical limit and locally causes the interphase to fail this will be reflected in a permanent increase of resistance, as certain conductive paths cease to exist.…”
Section: Preparation and Characterization Of Cnt-coated Gf Yarnsmentioning
confidence: 99%
“…The technique is based on sensing potential variations on the sample surface that were caused by electron charging. This contrast effect was known as early as 1957 [59] and was termed "voltage contrast". A discussion on this technique was conducted by Chung et al [60] in 1983 who monitored carbon black fillers.…”
Section: Introductionmentioning
confidence: 99%
“…The combined effect of secondary and field-emission is also possible through electron-stimulated field-emission [32,33], where electrons strike the tip of a nanoscale emitter under a strong applied field, leading to highly enhanced emission of further electrons. An applied electric field can also affect the emission and trajectories of secondary electrons emitted from a cathode, enabling voltage-contrast imaging in electron microscopy [34][35][36]. Finally, it is only natural to expect that more than two stimuli can also be employed, as in combining several of field, light, heat, and primary energetic particles all at once, to induce electron emission.…”
Section: Sourcementioning
confidence: 99%