UDC 533.9.08Using the methods of numerical simulation, we have investigated the dependence of the intensity and parameters of the spectral line profiles in the radiation of semitransparent plasma on its optical thickness, the degree of inhomogeneity, and the parameter distribution. As a model, we used the equilibrium plasma of argon with a given temperature profile on the observation line. The calculation has been performed for the spectral lines of the argon atom characterized by different broadening constants. On the basis of the results obtained it has been shown that it is possible to diagnose the plasma and determine the degree of its inhomogeneity and reabsorption by the parameters of the self-reversed profiles of the spectral lines. To diagnose the plasma in the absence of self-reversal, we propose to use the line intensities in the emission spectra of the plasma, including those obtained by probing it by its self-radiation.Introduction. In a number of recent works [1-4], we have developed an approach to the diagnostics of inhomogeneous plasma based on the analysis of the directly registered emission line spectra of the objects being investigated and the establishment of the relation between the spectral line characteristics and the local parameters of the plasma and their distribution along the observation line. The relations obtained permit local diagnostics of inhomogeneous, including axially asymmetric, plasma without using standard tomographic methods of the type of Abel inversion (in the case of axial symmetry). The methods developed for determining the plasma parameters have been used successfully to investigate electric arcs and plasma jets of technological purpose [5][6][7][8]. However, most of the results obtained pertain to optically transparent plasma and can only be used in the cases where the absorption in the spectral lines and its influence on their intensity and on the parameters of the profiles can be neglected. This fact considerably narrows the field of possible application of the developed methods, since real plasma formations, as a rule, are not optically thin, at least in the region of resonance spectral lines.The problem of the influence of absorption in the plasma on the spectral-line intensities and profiles in outgoing radiation is receiving a great deal of attention. A large number of works devoted to this problem, including theoretical ones, are known. Among the latter, the works of Bartels [9] and Cowan and Dicke [10], in which models of the formation of lines in the emission spectrum of semitransparent plasma were proposed, as well as Preobrazhensky's works, which are partially summarized in monograph [11], are noteworthy. Subsequently, the proposed models were widely used in experimental studies, and they were modified and supplemented (see, e.g., [12][13][14][15][16][17][18]). Experimental check has demonstrated the practical applicability of the models of [9][10][11]. However, the assumptions made considerably limit the field of their application. For example, the approxi...