2001
DOI: 10.1116/1.1349188
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Line of sight techniques: Providing an inventory of all species arriving at and departing from a surface

Abstract: Articles you may be interested inElectron induced dissociation of trimethyl (methylcyclopentadienyl) platinum (IV): Total cross section as a function of incident electron energy Adsorption and reaction of methanol on clean and oxygen modified rhodium/vanadium surface alloys Line of sight ͑LOS͒ techniques comprise those methods in which species emanating from a surface ͑atoms, molecules, and radicals͒ undergo just a single pass through the ionization volume of a mass spectrometer before being pumped. This is ac… Show more

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Cited by 27 publications
(15 citation statements)
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“…Additionally, the small diameter of the nanowires could possibly allow for dislocations to be "annealed" out of a structure by diffusing to the perimeter. 21 Unlike these studies, 21,22 since our deformation only occurred within the PMMA layer while the uncovered region remained unaffected, it was impossible to perform an in situ HRTEM on the strained region to atomistically quantify the deformation as either elastic or plastic. However, to SEM resolution each pillar appeared to undergo a macroscopically elastic deformation, returning to its original position after being freed from the PMMA even after several tens of bending and unbending cycles.…”
Section: Resultsmentioning
confidence: 92%
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“…Additionally, the small diameter of the nanowires could possibly allow for dislocations to be "annealed" out of a structure by diffusing to the perimeter. 21 Unlike these studies, 21,22 since our deformation only occurred within the PMMA layer while the uncovered region remained unaffected, it was impossible to perform an in situ HRTEM on the strained region to atomistically quantify the deformation as either elastic or plastic. However, to SEM resolution each pillar appeared to undergo a macroscopically elastic deformation, returning to its original position after being freed from the PMMA even after several tens of bending and unbending cycles.…”
Section: Resultsmentioning
confidence: 92%
“…Furthermore, these values fall within the range of reported values for strain in silicon nanowires under fracture-free polymerization incited deformation. 21,22 Possible mechanisms that could allow such extreme behavior have been studied previously [14][15][16] and rely on the relatively small volumes of nanowires resulting in the fabrication of statistically "defectfree" structures that lack sites for fracture nucleation. Additionally, the small diameter of the nanowires could possibly allow for dislocations to be "annealed" out of a structure by diffusing to the perimeter.…”
Section: Resultsmentioning
confidence: 99%
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“…1 In addition, n-type semiconductors based on perylene diimide or naphthalene diimide frameworks have been studied with OFETs comprised of evaporated films having high electron mobilities and ambient stability. [2][3][4][5] In this current work we report the n-type organic semiconductor properties of ͓2-͕͑7-͑9,9-di-n-propyl-9H-fluoren-2-yl͖benzo͓c͔͓1,2,5͔thiadiazol-4-yl͒methylene͔malononitrile ͑K12͒, Fig. 1͑a͒.…”
mentioning
confidence: 99%