1983
DOI: 10.1107/s0108767383000677
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Line profiles for a collection of identical crystals: effect of a linear transformation of shape

Abstract: A linear transformation is defined as a distortion of the unit lengths along three Cartesian axes and of their angles, preserving the same covariant coordinates of the corresponding points. The mathematical relationship between the line profiles of two mutually transformed crystals is proposed. It makes it possible, for example, to get the line profiles for ellipsoids, parallelepipeds, distorted tetrahedra and octahedra from the exact results reported by Langford & Wilson [J. Appl. Cryst. (1978), 11, 102-113]… Show more

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Cited by 4 publications
(2 citation statements)
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“…Despite the popularity of LPA, whether using the simple Scherrer formula or more advanced full-pattern modelling methods, few domain shapes have been considered so far. Models providing the powder diffraction line profile and related properties like the Scherrer constant (Langford & Wilson, 1978) are available for just a few regular shapes, including sphere, cube, tetrahedron, octahedron, cylinder and hexagonal prism, and some derived shapes, like ellipsoids and parallelepipeds (Langford & Wilson, 1978;Allegra & Wilson, 1983;Scardi & Leoni, 2001;Ungá r et al, 2005).…”
Section: Introductionmentioning
confidence: 99%
“…Despite the popularity of LPA, whether using the simple Scherrer formula or more advanced full-pattern modelling methods, few domain shapes have been considered so far. Models providing the powder diffraction line profile and related properties like the Scherrer constant (Langford & Wilson, 1978) are available for just a few regular shapes, including sphere, cube, tetrahedron, octahedron, cylinder and hexagonal prism, and some derived shapes, like ellipsoids and parallelepipeds (Langford & Wilson, 1978;Allegra & Wilson, 1983;Scardi & Leoni, 2001;Ungá r et al, 2005).…”
Section: Introductionmentioning
confidence: 99%
“…Powder diffraction techniques are widely used in experimental condensed matter physics to characterize structural and microstructural properties of materials with statistical significance (Wessels, 1999;Bish et al, 2013;Solla-Gullon et al, 2015). Interpretation of diffraction data is often supported by theoretical models of the material's unit structure and an understanding of the contributions from features affecting its periodicity in space, such as the size/shape of crystalline domains (Scherrer, 1918;Langford & Wilson, 1978;Allegra & Wilson, 1983;Scardi & Leoni, 2001) and lattice distortions within these (e.g. strain field, defects and stacking disorder) (Williamson & Hall, 1953;Ungá r et al, 2005).…”
Section: Introductionmentioning
confidence: 99%