2001
DOI: 10.1109/77.919474
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Line-splitting in high-resolution superconducting tunnel junction EUV detectors

Abstract: This is a preprint of a paper intended for publication in a journal or proceedings. Since changes may be made before publication, this preprint is made available with the understanding that it will not be cited or reproduced without the permission of the author.

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Cited by 4 publications
(2 citation statements)
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“…The degradation in resolution in the range between 100 and 200 eV arises from the fact that the top Nb film is partially transparent in this energy region. Photons are thus absorbed both in the Nb absorber and the Al trap underneath where the gap is smaller, and the difference in signal amplitude leads to a broadening of the observed line [13].…”
Section: Detector Performancementioning
confidence: 99%
“…The degradation in resolution in the range between 100 and 200 eV arises from the fact that the top Nb film is partially transparent in this energy region. Photons are thus absorbed both in the Nb absorber and the Al trap underneath where the gap is smaller, and the difference in signal amplitude leads to a broadening of the observed line [13].…”
Section: Detector Performancementioning
confidence: 99%
“…S INGLE-PHOTON spectrometers based on superconducting tunnel junctions (STJs) have been successfully used in astronomy in the optical range, and in the EUV through soft x-ray region for synchrotron studies [1]. These applications and biological microscopy applications would benefit if the STJ based photon detectors could achieve larger count rates, and were produced in larger arrays with multiplexable low-temperature readouts.…”
Section: Introductionmentioning
confidence: 99%