“…61 Intrinsic deteriorations involve problems in the stability of organic thin fi lm, interface between anode and organic layer, excited state stability, movement of ionic impurity, diffusion of transparent electrode metal into emission layer (indium migration mechanism), cation instability, large energy barrier for charge carriers, positive charges accumulation, and width of recombination zone. 56,57,61,63,69,70,[72][73][74][75][76][77] Adachi's group has reported that a large energy barrier for hole injection at the interface of ITO/HTL (hole transporting layer) would lead to large joule heat generation. The produced heat would steadily cause local aggregation of organic molecules such as dimerization and crystallization of an amorphous HTL.…”