2002
DOI: 10.2172/1191126
|View full text |Cite
|
Sign up to set email alerts
|

LLE Review Quarterly Report (January-March 2002). Volume 90

Abstract: Price codes: Printed Copy A04Microfiche A01 Semyon Papernov, a scientist in the Optical Technology Group, uses a Digital Instruments Nanoscope I11 atomic force microscope (AFM) operated in contact mode to evaluate the morphology of 3w laser-damage features on a multilayer, quarter-wave-stack OMEGA transport HR coating made from HfO, and Si02 Surface mapping of damaged and undamaged sites on production witness pieces by atomic force microscopy has shown that nodular growth defects, long considered to be the … Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...

Citation Types

0
0
0

Publication Types

Select...

Relationship

0
0

Authors

Journals

citations
Cited by 0 publications
references
References 7 publications
0
0
0
Order By: Relevance

No citations

Set email alert for when this publication receives citations?