Abstract:Price codes: Printed Copy A04Microfiche A01 Semyon Papernov, a scientist in the Optical Technology Group, uses a Digital Instruments Nanoscope I11 atomic force microscope (AFM) operated in contact mode to evaluate the morphology of 3w laser-damage features on a multilayer, quarter-wave-stack OMEGA transport HR coating made from HfO, and Si02 Surface mapping of damaged and undamaged sites on production witness pieces by atomic force microscopy has shown that nodular growth defects, long considered to be the … Show more
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