2023 IEEE 23rd International Conference on Software Quality, Reliability, and Security (QRS) 2023
DOI: 10.1109/qrs60937.2023.00029
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LLM for Test Script Generation and Migration: Challenges, Capabilities, and Opportunities

Shengcheng Yu,
Chunrong Fang,
Yuchen Ling
et al.
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Cited by 12 publications
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