2008 Third International Forum on Strategic Technologies 2008
DOI: 10.1109/ifost.2008.4602923
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Load spectrum generation using probabilistic random process and fatigue life prediction for automobile muffler structure

Abstract: The simulated load spectrum is constituted for the automobile muffler structure using probabilistic random process with the measured load data. By applying obtained spectrum load and evaluating residual strength degradation and failure probability, its fatigue life is assessed on the basis of two parameter Weibull distribution. To determine the required strength degradation model parameters, experimental tests of fatigue life are also performed on the welded specimens with same condition as real muffler struct… Show more

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